The theory of the line profile based on the absorption of X-ray diffraction and its experimental demonstration

We have studied the theory of the X-ray diffraction (XRD) absorption peak profile (Liu, K. et al., Adv X-ray Anal, 2010, 54, 17-23) in detail by further theoretical derivation and by verification of the experimental line profile of a standard sample. It was obtained that the deviation between theory...

Повний опис

Збережено в:
Бібліографічні деталі
Видавець:НТК «Інститут монокристалів» НАН України
Дата:2016
Автори: Liu Kejia, Xue Yin, Chen Kun
Формат: Стаття
Мова:English
Опубліковано: НТК «Інститут монокристалів» НАН України 2016
Назва видання:Functional Materials
Теми:
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/120613
Теги: Додати тег
Немає тегів, Будьте першим, хто поставить тег для цього запису!
Цитувати:The theory of the line profile based on the absorption of X-ray diffraction and its experimental demonstration / Liu Kejia, Xue Yin, Chen Kun // Functional Materials. — 2016. — Т. 23, № 2. — С. 212-217. — Бібліогр.: 5 назв. — англ.

Репозиторії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
Опис
Резюме:We have studied the theory of the X-ray diffraction (XRD) absorption peak profile (Liu, K. et al., Adv X-ray Anal, 2010, 54, 17-23) in detail by further theoretical derivation and by verification of the experimental line profile of a standard sample. It was obtained that the deviation between theory and experiment is less than 9% for the standard samples, by ignoring the line profiles in the range of diffraction angle less than 60°, for which the instrumental broadening could not be ignored. And the theoretical formula between FWHM and the Bragg angle 2θ was derived which can be called as the ARF. The results show that the Caglioti's relations should be replaced by the formula derived in this work.