New possibility of retrospective EPR dosimetry
Tooth enamel plates irradiated by different types of radiation were studied by electron paramagnetic resonance imaging with local gradient of magnetic field. The dependence of radiation defect distributions on an irradiation type was found. A new procedure of retrospective electron paramagnetic reso...
Збережено в:
| Дата: | 2000 |
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| Автори: | , , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2000
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| Назва видання: | Semiconductor Physics Quantum Electronics & Optoelectronics |
| Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/121114 |
| Теги: |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | New possibility of retrospective EPR dosimetry / I. Vorona, S. Ishchenko, S. Okulov, T.T. Petrenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2000. — Т. 3, № 2. — С. 219-222. — Бібліогр.: 13 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| Резюме: | Tooth enamel plates irradiated by different types of radiation were studied by electron paramagnetic resonance imaging with local gradient of magnetic field. The dependence of radiation defect distributions on an irradiation type was found. A new procedure of retrospective electron paramagnetic resonancedosimetry determining the irradiation type was proposed. |
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