Allowable deviation of LC layer thickness in cholesteric LCDs

The deviation of liquid crystal (LC) layer thickness in a display cell has considerable influence on the image quality at the addressing of cholesteric liquid crystal displays (ChLCD) by different kind of dynamic drive schemes. The driving principles that are realized in dynamic drive schemes by seq...

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Бібліографічні деталі
Дата:2002
Автори: Rybalochka, A., Sorokin, V., Sorokin, A.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2002
Назва видання:Semiconductor Physics Quantum Electronics & Optoelectronics
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/121126
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Allowable deviation of LC layer thickness in cholesteric LCDs / A. Rybalochka, V. Sorokin, A. Sorokin // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2002. — Т. 5, № 1. — С. 115-118. — Бібліогр.: 10 назв. — англ.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
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spelling irk-123456789-1211262017-06-14T03:06:29Z Allowable deviation of LC layer thickness in cholesteric LCDs Rybalochka, A. Sorokin, V. Sorokin, A. The deviation of liquid crystal (LC) layer thickness in a display cell has considerable influence on the image quality at the addressing of cholesteric liquid crystal displays (ChLCD) by different kind of dynamic drive schemes. The driving principles that are realized in dynamic drive schemes by sequences of voltage pulses apply certain limitations on the value of this deviation. In this paper, we have compared allowable relative deviation of the LC layer thickness for two simple two-level dynamic drive schemes in ChLCD by the “dynamic hysteresis” method. 2002 Article Allowable deviation of LC layer thickness in cholesteric LCDs / A. Rybalochka, V. Sorokin, A. Sorokin // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2002. — Т. 5, № 1. — С. 115-118. — Бібліогр.: 10 назв. — англ. 1560-8034 PACS: 78.20.-e http://dspace.nbuv.gov.ua/handle/123456789/121126 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
description The deviation of liquid crystal (LC) layer thickness in a display cell has considerable influence on the image quality at the addressing of cholesteric liquid crystal displays (ChLCD) by different kind of dynamic drive schemes. The driving principles that are realized in dynamic drive schemes by sequences of voltage pulses apply certain limitations on the value of this deviation. In this paper, we have compared allowable relative deviation of the LC layer thickness for two simple two-level dynamic drive schemes in ChLCD by the “dynamic hysteresis” method.
format Article
author Rybalochka, A.
Sorokin, V.
Sorokin, A.
spellingShingle Rybalochka, A.
Sorokin, V.
Sorokin, A.
Allowable deviation of LC layer thickness in cholesteric LCDs
Semiconductor Physics Quantum Electronics & Optoelectronics
author_facet Rybalochka, A.
Sorokin, V.
Sorokin, A.
author_sort Rybalochka, A.
title Allowable deviation of LC layer thickness in cholesteric LCDs
title_short Allowable deviation of LC layer thickness in cholesteric LCDs
title_full Allowable deviation of LC layer thickness in cholesteric LCDs
title_fullStr Allowable deviation of LC layer thickness in cholesteric LCDs
title_full_unstemmed Allowable deviation of LC layer thickness in cholesteric LCDs
title_sort allowable deviation of lc layer thickness in cholesteric lcds
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
publishDate 2002
url http://dspace.nbuv.gov.ua/handle/123456789/121126
citation_txt Allowable deviation of LC layer thickness in cholesteric LCDs / A. Rybalochka, V. Sorokin, A. Sorokin // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2002. — Т. 5, № 1. — С. 115-118. — Бібліогр.: 10 назв. — англ.
series Semiconductor Physics Quantum Electronics & Optoelectronics
work_keys_str_mv AT rybalochkaa allowabledeviationoflclayerthicknessincholestericlcds
AT sorokinv allowabledeviationoflclayerthicknessincholestericlcds
AT sorokina allowabledeviationoflclayerthicknessincholestericlcds
first_indexed 2023-10-18T20:38:44Z
last_indexed 2023-10-18T20:38:44Z
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