The influence of non-uniform deformation on photoelectric properties of crystalline silicon

Measurements of the photoconductivity (PC) and photomagnetic effect (PME) spectra of crystalline silicon were carried out for the sample under the non-uniform bend deformation. This deformation causes a decrease of the photoconductivity spectrum drop in the short-wave region when illuminating the st...

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Бібліографічні деталі
Дата:2000
Автори: Vakulenko, O.V., Kondratenko, S.V.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2000
Назва видання:Semiconductor Physics Quantum Electronics & Optoelectronics
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/121205
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:The influence of non-uniform deformation on photoelectric properties of crystalline silicon / O.V. Vakulenko, S.V. Kondratenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2000. — Т. 3, № 4. — С. 453-455. — Бібліогр.: 9 назв. — англ.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
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spelling irk-123456789-1212052017-06-14T03:07:20Z The influence of non-uniform deformation on photoelectric properties of crystalline silicon Vakulenko, O.V. Kondratenko, S.V. Measurements of the photoconductivity (PC) and photomagnetic effect (PME) spectra of crystalline silicon were carried out for the sample under the non-uniform bend deformation. This deformation causes a decrease of the photoconductivity spectrum drop in the short-wave region when illuminating the stretched surface. Under constant deformation conditions the PME spectrum form is changed only in the long-wave region. Obtained data are explained by diffusion length decreasing as a consequence of decreasing diffusion coefficient under the influence of a strain gradient. 2000 Article The influence of non-uniform deformation on photoelectric properties of crystalline silicon / O.V. Vakulenko, S.V. Kondratenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2000. — Т. 3, № 4. — С. 453-455. — Бібліогр.: 9 назв. — англ. 1560-8034 PACS: 72.40. http://dspace.nbuv.gov.ua/handle/123456789/121205 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
description Measurements of the photoconductivity (PC) and photomagnetic effect (PME) spectra of crystalline silicon were carried out for the sample under the non-uniform bend deformation. This deformation causes a decrease of the photoconductivity spectrum drop in the short-wave region when illuminating the stretched surface. Under constant deformation conditions the PME spectrum form is changed only in the long-wave region. Obtained data are explained by diffusion length decreasing as a consequence of decreasing diffusion coefficient under the influence of a strain gradient.
format Article
author Vakulenko, O.V.
Kondratenko, S.V.
spellingShingle Vakulenko, O.V.
Kondratenko, S.V.
The influence of non-uniform deformation on photoelectric properties of crystalline silicon
Semiconductor Physics Quantum Electronics & Optoelectronics
author_facet Vakulenko, O.V.
Kondratenko, S.V.
author_sort Vakulenko, O.V.
title The influence of non-uniform deformation on photoelectric properties of crystalline silicon
title_short The influence of non-uniform deformation on photoelectric properties of crystalline silicon
title_full The influence of non-uniform deformation on photoelectric properties of crystalline silicon
title_fullStr The influence of non-uniform deformation on photoelectric properties of crystalline silicon
title_full_unstemmed The influence of non-uniform deformation on photoelectric properties of crystalline silicon
title_sort influence of non-uniform deformation on photoelectric properties of crystalline silicon
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
publishDate 2000
url http://dspace.nbuv.gov.ua/handle/123456789/121205
citation_txt The influence of non-uniform deformation on photoelectric properties of crystalline silicon / O.V. Vakulenko, S.V. Kondratenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2000. — Т. 3, № 4. — С. 453-455. — Бібліогр.: 9 назв. — англ.
series Semiconductor Physics Quantum Electronics & Optoelectronics
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first_indexed 2023-10-18T20:38:51Z
last_indexed 2023-10-18T20:38:51Z
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