Dimensional effects in thin gold films
Research results of optical constants of thin gold films of different thickness are given in the paper. Their structure was studied using atomic-force microscope. Values of refraction n and absorption k coefficients were calculated from reflection and transmission spectra by traditional ratios, and...
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Дата: | 2000 |
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Автор: | |
Формат: | Стаття |
Мова: | English |
Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2000
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Назва видання: | Semiconductor Physics Quantum Electronics & Optoelectronics |
Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/121215 |
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Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
Цитувати: | Dimensional effects in thin gold films / S.A. Kovalenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2000. — Т. 3, № 4. — С. 514-519. — Бібліогр.: 21 назв. — англ. |
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irk-123456789-1212152017-06-14T03:07:48Z Dimensional effects in thin gold films Kovalenko, S.A. Research results of optical constants of thin gold films of different thickness are given in the paper. Their structure was studied using atomic-force microscope. Values of refraction n and absorption k coefficients were calculated from reflection and transmission spectra by traditional ratios, and using new theory as well. Comparison of results obtained by both methods was carried out and possible causes of divergences were pointed out. 2000 Article Dimensional effects in thin gold films / S.A. Kovalenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2000. — Т. 3, № 4. — С. 514-519. — Бібліогр.: 21 назв. — англ. 1560-8034 PACS: 78.20.C, 78.66 http://dspace.nbuv.gov.ua/handle/123456789/121215 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine |
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English |
description |
Research results of optical constants of thin gold films of different thickness are given in the paper. Their structure was studied using atomic-force microscope. Values of refraction n and absorption k coefficients were calculated from reflection and transmission spectra by traditional ratios, and using new theory as well. Comparison of results obtained by both methods was carried out and possible causes of divergences were pointed out. |
format |
Article |
author |
Kovalenko, S.A. |
spellingShingle |
Kovalenko, S.A. Dimensional effects in thin gold films Semiconductor Physics Quantum Electronics & Optoelectronics |
author_facet |
Kovalenko, S.A. |
author_sort |
Kovalenko, S.A. |
title |
Dimensional effects in thin gold films |
title_short |
Dimensional effects in thin gold films |
title_full |
Dimensional effects in thin gold films |
title_fullStr |
Dimensional effects in thin gold films |
title_full_unstemmed |
Dimensional effects in thin gold films |
title_sort |
dimensional effects in thin gold films |
publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
publishDate |
2000 |
url |
http://dspace.nbuv.gov.ua/handle/123456789/121215 |
citation_txt |
Dimensional effects in thin gold films / S.A. Kovalenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2000. — Т. 3, № 4. — С. 514-519. — Бібліогр.: 21 назв. — англ. |
series |
Semiconductor Physics Quantum Electronics & Optoelectronics |
work_keys_str_mv |
AT kovalenkosa dimensionaleffectsinthingoldfilms |
first_indexed |
2023-10-18T20:38:55Z |
last_indexed |
2023-10-18T20:38:55Z |
_version_ |
1796150749103652864 |