Modelling optical spectra and obtaining information on parameters and features of semiconductor structures
Problems of semiconductor optical spectrum identification are considered in the paper. Some models for description of optical reflection spectra in semiconductors and semiconductor structures are presented. Shown is the possibility to obtain information upon various parameters and characteristics of...
Збережено в:
| Дата: | 2002 |
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| Автор: | |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2002
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| Назва видання: | Semiconductor Physics Quantum Electronics & Optoelectronics |
| Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/121299 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Modelling optical spectra and obtaining information on parameters and features of semiconductor structures / V.A. Vasiljev // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2002. — Т. 5, № 3. — С. 288-293. — Бібліогр.: 13 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| Резюме: | Problems of semiconductor optical spectrum identification are considered in the paper. Some models for description of optical reflection spectra in semiconductors and semiconductor structures are presented. Shown is the possibility to obtain information upon various parameters and characteristics of semiconductors and their structures by fitting theoretical spectra to experimental data. The estimation of validity and accuracy of obtained information is given. |
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