Bi nanolines characterization by linear optical methods
The present paper dedicated to experimental investigations of optical properties of Bi/Si(001) interfaces and Bi nanolines in a wide spectral range (1eV). The experimental study of optical absorption spectrum showed the widening of the optical band gap of Bi/Si(001) interfaces with increasing the bi...
Збережено в:
| Видавець: | НТК «Інститут монокристалів» НАН України |
|---|---|
| Дата: | 2016 |
| Автори: | , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
НТК «Інститут монокристалів» НАН України
2016
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| Назва видання: | Functional Materials |
| Теми: | |
| Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/121381 |
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| Цитувати: | Bi nanolines characterization by linear optical methods / V.V. Buchenko, A.A. Goloborodko // Functional Materials. — 2016. — Т. 23, № 3. — С. 387-393. — Бібліогр.: 46 назв. — англ. |
Репозиторії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
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irk-123456789-1213812017-06-15T03:02:31Z Bi nanolines characterization by linear optical methods Buchenko, V.V. Goloborodko, A.A. Characterization and properties The present paper dedicated to experimental investigations of optical properties of Bi/Si(001) interfaces and Bi nanolines in a wide spectral range (1eV). The experimental study of optical absorption spectrum showed the widening of the optical band gap of Bi/Si(001) interfaces with increasing the bismuth coverage, whereas after nanolines formation the width of the optical band gap decreases. Features of the experimentally obtained reflectance anisotropy spectra and surface differential reflectance spectra concerned with changing of the silicon surface reconstruction from 2x1 to 1x1 with the increasing of the bismuth covering degree from 0.5 ML to 1 ML. The experimental study of reflectance anisotropy spectra and surface differential reflectance spectra of Bi nanolines shows that the bismuth atoms are still present on the surface of the substrate in small amount, but the optical properties of such structures are determined by Si dimers. 2016 Article Bi nanolines characterization by linear optical methods / V.V. Buchenko, A.A. Goloborodko // Functional Materials. — 2016. — Т. 23, № 3. — С. 387-393. — Бібліогр.: 46 назв. — англ. 1027-5495 DOI: dx.doi.org/10.15407/fm23.03.387 http://dspace.nbuv.gov.ua/handle/123456789/121381 en Functional Materials НТК «Інститут монокристалів» НАН України |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| language |
English |
| topic |
Characterization and properties Characterization and properties |
| spellingShingle |
Characterization and properties Characterization and properties Buchenko, V.V. Goloborodko, A.A. Bi nanolines characterization by linear optical methods Functional Materials |
| description |
The present paper dedicated to experimental investigations of optical properties of Bi/Si(001) interfaces and Bi nanolines in a wide spectral range (1eV). The experimental study of optical absorption spectrum showed the widening of the optical band gap of Bi/Si(001) interfaces with increasing the bismuth coverage, whereas after nanolines formation the width of the optical band gap decreases. Features of the experimentally obtained reflectance anisotropy spectra and surface differential reflectance spectra concerned with changing of the silicon surface reconstruction from 2x1 to 1x1 with the increasing of the bismuth covering degree from 0.5 ML to 1 ML. The experimental study of reflectance anisotropy spectra and surface differential reflectance spectra of Bi nanolines shows that the bismuth atoms are still present on the surface of the substrate in small amount, but the optical properties of such structures are determined by Si dimers. |
| format |
Article |
| author |
Buchenko, V.V. Goloborodko, A.A. |
| author_facet |
Buchenko, V.V. Goloborodko, A.A. |
| author_sort |
Buchenko, V.V. |
| title |
Bi nanolines characterization by linear optical methods |
| title_short |
Bi nanolines characterization by linear optical methods |
| title_full |
Bi nanolines characterization by linear optical methods |
| title_fullStr |
Bi nanolines characterization by linear optical methods |
| title_full_unstemmed |
Bi nanolines characterization by linear optical methods |
| title_sort |
bi nanolines characterization by linear optical methods |
| publisher |
НТК «Інститут монокристалів» НАН України |
| publishDate |
2016 |
| topic_facet |
Characterization and properties |
| url |
http://dspace.nbuv.gov.ua/handle/123456789/121381 |
| citation_txt |
Bi nanolines characterization by linear optical methods / V.V. Buchenko, A.A. Goloborodko // Functional Materials. — 2016. — Т. 23, № 3. — С. 387-393. — Бібліогр.: 46 назв. — англ. |
| series |
Functional Materials |
| work_keys_str_mv |
AT buchenkovv binanolinescharacterizationbylinearopticalmethods AT goloborodkoaa binanolinescharacterizationbylinearopticalmethods |
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2023-10-18T20:39:19Z |
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2023-10-18T20:39:19Z |
| _version_ |
1796150766458634240 |