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Optical studies of as-deposited and annealed Cu₇GeS₅I thin films

Optical studies of as-deposited and annealed Cu₇GeS₅I thin films

Cu₇GeS₅I thin films were obtained by non-reactive radio frequency magnetron sputtering onto silicate glass substrates. Optical transmission spectra of as-deposited and annealed Cu₇GeS₅I thin films were measured in the temperature interval 77–300 K. The temperature behaviour of Urbach absorption edge...

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Bibliographic Details
Main Authors: Studenyak, I.P., Bendak, A.V., Rybak, S.O., Izai, V.Yu., Kúš, P., Mikula, M.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2016
Series:Semiconductor Physics Quantum Electronics & Optoelectronics
Online Access:http://dspace.nbuv.gov.ua/handle/123456789/121563
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Summary:Cu₇GeS₅I thin films were obtained by non-reactive radio frequency magnetron sputtering onto silicate glass substrates. Optical transmission spectra of as-deposited and annealed Cu₇GeS₅I thin films were measured in the temperature interval 77–300 K. The temperature behaviour of Urbach absorption edge and dispersion of refractive index for as-deposited and annealed Cu₇GeS₅I thin films was analyzed. Influence of annealing on the optical parameters and disordering processes in Cu₇GeS₅I thin films was studied.

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