Classic Ronchi test and its variants for quality control of various optical surfaces
Performed in this work is the analysis of the optical Ronchi interferometer circuit and its upgrading to test quality of various optical surfaces. Briefly described in this paper is the classic test by Ronchi, shown is every upgraded circuit diagram of the interferometer and their principle of opera...
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| Видавець: | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
|---|---|
| Дата: | 2016 |
| Автори: | , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2016
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| Назва видання: | Semiconductor Physics Quantum Electronics & Optoelectronics |
| Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/121606 |
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| Цитувати: | Classic Ronchi test and its variants for quality control of various optical surfaces / A.S. Malenko, V.N. Borovytsky // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 3. — С. 311-314. — Бібліогр.: 13 назв. — англ. |
Репозиторії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
irk-123456789-121606 |
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irk-123456789-1216062017-06-15T03:05:52Z Classic Ronchi test and its variants for quality control of various optical surfaces Malenko, A.S. Borovytsky, V.N. Performed in this work is the analysis of the optical Ronchi interferometer circuit and its upgrading to test quality of various optical surfaces. Briefly described in this paper is the classic test by Ronchi, shown is every upgraded circuit diagram of the interferometer and their principle of operation. Also, it is demonstrated interferential patterns for each method allowing one to determine which aberrations are present in the tested optics. With this method, when one can only visually detect aberrations, it seems to be not accurate. But with digital image processing the interferential pattern, special mathematical models and algorithms, aberrations that are present in the optical surface can be calculated with very high accuracy. Therefore, the methods of control offered in this paper provide fast and accurate results for the data circuits to be simply assembled and configured. 2016 Article Classic Ronchi test and its variants for quality control of various optical surfaces / A.S. Malenko, V.N. Borovytsky // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 3. — С. 311-314. — Бібліогр.: 13 назв. — англ. 1560-8034 DOI: 10.15407/spqeo19.03.311 PACS 42.15.Fr http://dspace.nbuv.gov.ua/handle/123456789/121606 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| language |
English |
| description |
Performed in this work is the analysis of the optical Ronchi interferometer circuit and its upgrading to test quality of various optical surfaces. Briefly described in this paper is the classic test by Ronchi, shown is every upgraded circuit diagram of the interferometer and their principle of operation. Also, it is demonstrated interferential patterns for each method allowing one to determine which aberrations are present in the tested optics. With this method, when one can only visually detect aberrations, it seems to be not accurate. But with digital image processing the interferential pattern, special mathematical models and algorithms, aberrations that are present in the optical surface can be calculated with very high accuracy. Therefore, the methods of control offered in this paper provide fast and accurate results for the data circuits to be simply assembled and configured. |
| format |
Article |
| author |
Malenko, A.S. Borovytsky, V.N. |
| spellingShingle |
Malenko, A.S. Borovytsky, V.N. Classic Ronchi test and its variants for quality control of various optical surfaces Semiconductor Physics Quantum Electronics & Optoelectronics |
| author_facet |
Malenko, A.S. Borovytsky, V.N. |
| author_sort |
Malenko, A.S. |
| title |
Classic Ronchi test and its variants for quality control of various optical surfaces |
| title_short |
Classic Ronchi test and its variants for quality control of various optical surfaces |
| title_full |
Classic Ronchi test and its variants for quality control of various optical surfaces |
| title_fullStr |
Classic Ronchi test and its variants for quality control of various optical surfaces |
| title_full_unstemmed |
Classic Ronchi test and its variants for quality control of various optical surfaces |
| title_sort |
classic ronchi test and its variants for quality control of various optical surfaces |
| publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| publishDate |
2016 |
| url |
http://dspace.nbuv.gov.ua/handle/123456789/121606 |
| citation_txt |
Classic Ronchi test and its variants for quality control of various optical surfaces / A.S. Malenko, V.N. Borovytsky // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 3. — С. 311-314. — Бібліогр.: 13 назв. — англ. |
| series |
Semiconductor Physics Quantum Electronics & Optoelectronics |
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2023-10-18T20:39:52Z |
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