Method for replacing objects in 4F correlator: testing

The method of pattern recognition based on replacement of object images incoming to the correlator by object-dependent synthesized phase objects calculated using the iterative Fourier-transform algorithm was developed by us earlier. In this work, we performed experimental testing the above method by...

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Видавець:Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Дата:2005
Автори: Yezhov, P.V., Kuzmenko, A.V., Smirnova, Т.N., Ivanovskyy, A. A.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2005
Назва видання:Semiconductor Physics Quantum Electronics & Optoelectronics
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/121649
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Цитувати:Method for replacing objects in 4F correlator: testing / P.V. Yezhov, A.V. Kuzmenko, Т.N. Smirnova, A. A. Ivanovskyy // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 2. — С. 75-80. — Бібліогр.: 13 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id irk-123456789-121649
record_format dspace
spelling irk-123456789-1216492017-06-16T03:03:32Z Method for replacing objects in 4F correlator: testing Yezhov, P.V. Kuzmenko, A.V. Smirnova, Т.N. Ivanovskyy, A. A. The method of pattern recognition based on replacement of object images incoming to the correlator by object-dependent synthesized phase objects calculated using the iterative Fourier-transform algorithm was developed by us earlier. In this work, we performed experimental testing the above method by using an optical-digital 4F-correlator. Synthesized phase objects were inputed into the correlator through the spatial light modulator LC2002. Holographic matched filters were recorded using self-developing photopolymers PPC-488. For two test objects, we obtained unified (δ-like) correlation signals with the signal-to-noise ratio reaching 24 dB, while the diffraction efficiency of these filters was up to 30%. 2005 Article Method for replacing objects in 4F correlator: testing / P.V. Yezhov, A.V. Kuzmenko, Т.N. Smirnova, A. A. Ivanovskyy // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 2. — С. 75-80. — Бібліогр.: 13 назв. — англ. 1560-8034 PACS: 05.50. +q, 61.50.Em, 82.20.Fd http://dspace.nbuv.gov.ua/handle/123456789/121649 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
description The method of pattern recognition based on replacement of object images incoming to the correlator by object-dependent synthesized phase objects calculated using the iterative Fourier-transform algorithm was developed by us earlier. In this work, we performed experimental testing the above method by using an optical-digital 4F-correlator. Synthesized phase objects were inputed into the correlator through the spatial light modulator LC2002. Holographic matched filters were recorded using self-developing photopolymers PPC-488. For two test objects, we obtained unified (δ-like) correlation signals with the signal-to-noise ratio reaching 24 dB, while the diffraction efficiency of these filters was up to 30%.
format Article
author Yezhov, P.V.
Kuzmenko, A.V.
Smirnova, Т.N.
Ivanovskyy, A. A.
spellingShingle Yezhov, P.V.
Kuzmenko, A.V.
Smirnova, Т.N.
Ivanovskyy, A. A.
Method for replacing objects in 4F correlator: testing
Semiconductor Physics Quantum Electronics & Optoelectronics
author_facet Yezhov, P.V.
Kuzmenko, A.V.
Smirnova, Т.N.
Ivanovskyy, A. A.
author_sort Yezhov, P.V.
title Method for replacing objects in 4F correlator: testing
title_short Method for replacing objects in 4F correlator: testing
title_full Method for replacing objects in 4F correlator: testing
title_fullStr Method for replacing objects in 4F correlator: testing
title_full_unstemmed Method for replacing objects in 4F correlator: testing
title_sort method for replacing objects in 4f correlator: testing
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
publishDate 2005
url http://dspace.nbuv.gov.ua/handle/123456789/121649
citation_txt Method for replacing objects in 4F correlator: testing / P.V. Yezhov, A.V. Kuzmenko, Т.N. Smirnova, A. A. Ivanovskyy // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 2. — С. 75-80. — Бібліогр.: 13 назв. — англ.
series Semiconductor Physics Quantum Electronics & Optoelectronics
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AT kuzmenkoav methodforreplacingobjectsin4fcorrelatortesting
AT smirnovatn methodforreplacingobjectsin4fcorrelatortesting
AT ivanovskyyaa methodforreplacingobjectsin4fcorrelatortesting
first_indexed 2023-10-18T20:39:58Z
last_indexed 2023-10-18T20:39:58Z
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