Method for replacing objects in 4F correlator: testing
The method of pattern recognition based on replacement of object images incoming to the correlator by object-dependent synthesized phase objects calculated using the iterative Fourier-transform algorithm was developed by us earlier. In this work, we performed experimental testing the above method by...
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Дата: | 2005 |
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Автори: | , , , |
Формат: | Стаття |
Мова: | English |
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2005
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Назва видання: | Semiconductor Physics Quantum Electronics & Optoelectronics |
Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/121649 |
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Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
Цитувати: | Method for replacing objects in 4F correlator: testing / P.V. Yezhov, A.V. Kuzmenko, Т.N. Smirnova, A. A. Ivanovskyy // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 2. — С. 75-80. — Бібліогр.: 13 назв. — англ. |
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irk-123456789-1216492017-06-16T03:03:32Z Method for replacing objects in 4F correlator: testing Yezhov, P.V. Kuzmenko, A.V. Smirnova, Т.N. Ivanovskyy, A. A. The method of pattern recognition based on replacement of object images incoming to the correlator by object-dependent synthesized phase objects calculated using the iterative Fourier-transform algorithm was developed by us earlier. In this work, we performed experimental testing the above method by using an optical-digital 4F-correlator. Synthesized phase objects were inputed into the correlator through the spatial light modulator LC2002. Holographic matched filters were recorded using self-developing photopolymers PPC-488. For two test objects, we obtained unified (δ-like) correlation signals with the signal-to-noise ratio reaching 24 dB, while the diffraction efficiency of these filters was up to 30%. 2005 Article Method for replacing objects in 4F correlator: testing / P.V. Yezhov, A.V. Kuzmenko, Т.N. Smirnova, A. A. Ivanovskyy // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 2. — С. 75-80. — Бібліогр.: 13 назв. — англ. 1560-8034 PACS: 05.50. +q, 61.50.Em, 82.20.Fd http://dspace.nbuv.gov.ua/handle/123456789/121649 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
collection |
DSpace DC |
language |
English |
description |
The method of pattern recognition based on replacement of object images incoming to the correlator by object-dependent synthesized phase objects calculated using the iterative Fourier-transform algorithm was developed by us earlier. In this work, we performed experimental testing the above method by using an optical-digital 4F-correlator. Synthesized phase objects were inputed into the correlator through the spatial light modulator LC2002. Holographic matched filters were recorded using self-developing photopolymers PPC-488. For two test objects, we obtained unified (δ-like) correlation signals with the signal-to-noise ratio reaching 24 dB, while the diffraction efficiency of these filters was up to 30%. |
format |
Article |
author |
Yezhov, P.V. Kuzmenko, A.V. Smirnova, Т.N. Ivanovskyy, A. A. |
spellingShingle |
Yezhov, P.V. Kuzmenko, A.V. Smirnova, Т.N. Ivanovskyy, A. A. Method for replacing objects in 4F correlator: testing Semiconductor Physics Quantum Electronics & Optoelectronics |
author_facet |
Yezhov, P.V. Kuzmenko, A.V. Smirnova, Т.N. Ivanovskyy, A. A. |
author_sort |
Yezhov, P.V. |
title |
Method for replacing objects in 4F correlator: testing |
title_short |
Method for replacing objects in 4F correlator: testing |
title_full |
Method for replacing objects in 4F correlator: testing |
title_fullStr |
Method for replacing objects in 4F correlator: testing |
title_full_unstemmed |
Method for replacing objects in 4F correlator: testing |
title_sort |
method for replacing objects in 4f correlator: testing |
publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
publishDate |
2005 |
url |
http://dspace.nbuv.gov.ua/handle/123456789/121649 |
citation_txt |
Method for replacing objects in 4F correlator: testing / P.V. Yezhov, A.V. Kuzmenko, Т.N. Smirnova, A. A. Ivanovskyy // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 2. — С. 75-80. — Бібліогр.: 13 назв. — англ. |
series |
Semiconductor Physics Quantum Electronics & Optoelectronics |
work_keys_str_mv |
AT yezhovpv methodforreplacingobjectsin4fcorrelatortesting AT kuzmenkoav methodforreplacingobjectsin4fcorrelatortesting AT smirnovatn methodforreplacingobjectsin4fcorrelatortesting AT ivanovskyyaa methodforreplacingobjectsin4fcorrelatortesting |
first_indexed |
2023-10-18T20:39:58Z |
last_indexed |
2023-10-18T20:39:58Z |
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1796150794664280064 |