Thermally stimulated exoelectron emission from solid Xe

Thermally-stimulated emission of exoelectrons and photons from solid Xe pre-irradiated by low-energy electrons were studied. A high sensitivity of thermally-stimulated luminescence (TSL) and thermally-stimulated exoelectron emission (TSEE) to sample prehistory was demonstrated. It was shown that e...

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Дата:2007
Автори: Khyzhniy, I.V., Grigorashchenko, O.N., Ponomaryov, A.N., Savchenko, E.V., Bondybey, V.E.
Формат: Стаття
Мова:English
Опубліковано: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2007
Назва видання:Физика низких температур
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Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/121792
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Thermally stimulated exoelectron emission from solid Xe / I.V. Khyzhniy, O.N. Grigorashchenko, A.N. Ponomaryov, E.V. Savchenko, V.E. Bondybey // Физика низких температур. — 2007. — Т. 33, № 6-7. — С. 701-704. — Бібліогр.: 11 назв. — рос.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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spelling irk-123456789-1217922017-06-17T03:02:59Z Thermally stimulated exoelectron emission from solid Xe Khyzhniy, I.V. Grigorashchenko, O.N. Ponomaryov, A.N. Savchenko, E.V. Bondybey, V.E. Electronic Processes in Cryocrystals Thermally-stimulated emission of exoelectrons and photons from solid Xe pre-irradiated by low-energy electrons were studied. A high sensitivity of thermally-stimulated luminescence (TSL) and thermally-stimulated exoelectron emission (TSEE) to sample prehistory was demonstrated. It was shown that electron traps in unannealed samples are characterized by a much broader distribution of trap levels in comparison with annealed samples and their concentration exceeds in number that in annealed samples. Both phenomena, TSL and TSEE, were found to be triggered by release of electrons from the same kind of traps. The data obtained suggest a competition between two relaxation channels: charge recombination and electron transport terminated by TSL and TSEE. It was found that TSEE predominates at low temperatures while at higher temperatures TSL prevails. An additional relaxation channel, a photon-stimulated exoelectron emission from pre-irradiated solid Xe, was revealed. 2007 Article Thermally stimulated exoelectron emission from solid Xe / I.V. Khyzhniy, O.N. Grigorashchenko, A.N. Ponomaryov, E.V. Savchenko, V.E. Bondybey // Физика низких температур. — 2007. — Т. 33, № 6-7. — С. 701-704. — Бібліогр.: 11 назв. — рос. 0132-6414 PACS: 78.60.Kn; 79.75.+g http://dspace.nbuv.gov.ua/handle/123456789/121792 en Физика низких температур Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
topic Electronic Processes in Cryocrystals
Electronic Processes in Cryocrystals
spellingShingle Electronic Processes in Cryocrystals
Electronic Processes in Cryocrystals
Khyzhniy, I.V.
Grigorashchenko, O.N.
Ponomaryov, A.N.
Savchenko, E.V.
Bondybey, V.E.
Thermally stimulated exoelectron emission from solid Xe
Физика низких температур
description Thermally-stimulated emission of exoelectrons and photons from solid Xe pre-irradiated by low-energy electrons were studied. A high sensitivity of thermally-stimulated luminescence (TSL) and thermally-stimulated exoelectron emission (TSEE) to sample prehistory was demonstrated. It was shown that electron traps in unannealed samples are characterized by a much broader distribution of trap levels in comparison with annealed samples and their concentration exceeds in number that in annealed samples. Both phenomena, TSL and TSEE, were found to be triggered by release of electrons from the same kind of traps. The data obtained suggest a competition between two relaxation channels: charge recombination and electron transport terminated by TSL and TSEE. It was found that TSEE predominates at low temperatures while at higher temperatures TSL prevails. An additional relaxation channel, a photon-stimulated exoelectron emission from pre-irradiated solid Xe, was revealed.
format Article
author Khyzhniy, I.V.
Grigorashchenko, O.N.
Ponomaryov, A.N.
Savchenko, E.V.
Bondybey, V.E.
author_facet Khyzhniy, I.V.
Grigorashchenko, O.N.
Ponomaryov, A.N.
Savchenko, E.V.
Bondybey, V.E.
author_sort Khyzhniy, I.V.
title Thermally stimulated exoelectron emission from solid Xe
title_short Thermally stimulated exoelectron emission from solid Xe
title_full Thermally stimulated exoelectron emission from solid Xe
title_fullStr Thermally stimulated exoelectron emission from solid Xe
title_full_unstemmed Thermally stimulated exoelectron emission from solid Xe
title_sort thermally stimulated exoelectron emission from solid xe
publisher Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
publishDate 2007
topic_facet Electronic Processes in Cryocrystals
url http://dspace.nbuv.gov.ua/handle/123456789/121792
citation_txt Thermally stimulated exoelectron emission from solid Xe / I.V. Khyzhniy, O.N. Grigorashchenko, A.N. Ponomaryov, E.V. Savchenko, V.E. Bondybey // Физика низких температур. — 2007. — Т. 33, № 6-7. — С. 701-704. — Бібліогр.: 11 назв. — рос.
series Физика низких температур
work_keys_str_mv AT khyzhniyiv thermallystimulatedexoelectronemissionfromsolidxe
AT grigorashchenkoon thermallystimulatedexoelectronemissionfromsolidxe
AT ponomaryovan thermallystimulatedexoelectronemissionfromsolidxe
AT savchenkoev thermallystimulatedexoelectronemissionfromsolidxe
AT bondybeyve thermallystimulatedexoelectronemissionfromsolidxe
first_indexed 2023-10-18T20:40:19Z
last_indexed 2023-10-18T20:40:19Z
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