Thermally stimulated exoelectron emission from solid Xe
Thermally-stimulated emission of exoelectrons and photons from solid Xe pre-irradiated by low-energy electrons were studied. A high sensitivity of thermally-stimulated luminescence (TSL) and thermally-stimulated exoelectron emission (TSEE) to sample prehistory was demonstrated. It was shown that e...
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Дата: | 2007 |
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Автори: | , , , , |
Формат: | Стаття |
Мова: | English |
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Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
2007
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Назва видання: | Физика низких температур |
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Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/121792 |
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Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
Цитувати: | Thermally stimulated exoelectron emission from solid Xe / I.V. Khyzhniy, O.N. Grigorashchenko, A.N. Ponomaryov, E.V. Savchenko, V.E. Bondybey // Физика низких температур. — 2007. — Т. 33, № 6-7. — С. 701-704. — Бібліогр.: 11 назв. — рос. |
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irk-123456789-1217922017-06-17T03:02:59Z Thermally stimulated exoelectron emission from solid Xe Khyzhniy, I.V. Grigorashchenko, O.N. Ponomaryov, A.N. Savchenko, E.V. Bondybey, V.E. Electronic Processes in Cryocrystals Thermally-stimulated emission of exoelectrons and photons from solid Xe pre-irradiated by low-energy electrons were studied. A high sensitivity of thermally-stimulated luminescence (TSL) and thermally-stimulated exoelectron emission (TSEE) to sample prehistory was demonstrated. It was shown that electron traps in unannealed samples are characterized by a much broader distribution of trap levels in comparison with annealed samples and their concentration exceeds in number that in annealed samples. Both phenomena, TSL and TSEE, were found to be triggered by release of electrons from the same kind of traps. The data obtained suggest a competition between two relaxation channels: charge recombination and electron transport terminated by TSL and TSEE. It was found that TSEE predominates at low temperatures while at higher temperatures TSL prevails. An additional relaxation channel, a photon-stimulated exoelectron emission from pre-irradiated solid Xe, was revealed. 2007 Article Thermally stimulated exoelectron emission from solid Xe / I.V. Khyzhniy, O.N. Grigorashchenko, A.N. Ponomaryov, E.V. Savchenko, V.E. Bondybey // Физика низких температур. — 2007. — Т. 33, № 6-7. — С. 701-704. — Бібліогр.: 11 назв. — рос. 0132-6414 PACS: 78.60.Kn; 79.75.+g http://dspace.nbuv.gov.ua/handle/123456789/121792 en Физика низких температур Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України |
institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
collection |
DSpace DC |
language |
English |
topic |
Electronic Processes in Cryocrystals Electronic Processes in Cryocrystals |
spellingShingle |
Electronic Processes in Cryocrystals Electronic Processes in Cryocrystals Khyzhniy, I.V. Grigorashchenko, O.N. Ponomaryov, A.N. Savchenko, E.V. Bondybey, V.E. Thermally stimulated exoelectron emission from solid Xe Физика низких температур |
description |
Thermally-stimulated emission of exoelectrons and photons from solid Xe pre-irradiated by low-energy
electrons were studied. A high sensitivity of thermally-stimulated luminescence (TSL) and thermally-stimulated
exoelectron emission (TSEE) to sample prehistory was demonstrated. It was shown that electron traps
in unannealed samples are characterized by a much broader distribution of trap levels in comparison with annealed
samples and their concentration exceeds in number that in annealed samples. Both phenomena, TSL
and TSEE, were found to be triggered by release of electrons from the same kind of traps. The data obtained
suggest a competition between two relaxation channels: charge recombination and electron transport terminated
by TSL and TSEE. It was found that TSEE predominates at low temperatures while at higher temperatures
TSL prevails. An additional relaxation channel, a photon-stimulated exoelectron emission from pre-irradiated
solid Xe, was revealed. |
format |
Article |
author |
Khyzhniy, I.V. Grigorashchenko, O.N. Ponomaryov, A.N. Savchenko, E.V. Bondybey, V.E. |
author_facet |
Khyzhniy, I.V. Grigorashchenko, O.N. Ponomaryov, A.N. Savchenko, E.V. Bondybey, V.E. |
author_sort |
Khyzhniy, I.V. |
title |
Thermally stimulated exoelectron emission from solid Xe |
title_short |
Thermally stimulated exoelectron emission from solid Xe |
title_full |
Thermally stimulated exoelectron emission from solid Xe |
title_fullStr |
Thermally stimulated exoelectron emission from solid Xe |
title_full_unstemmed |
Thermally stimulated exoelectron emission from solid Xe |
title_sort |
thermally stimulated exoelectron emission from solid xe |
publisher |
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України |
publishDate |
2007 |
topic_facet |
Electronic Processes in Cryocrystals |
url |
http://dspace.nbuv.gov.ua/handle/123456789/121792 |
citation_txt |
Thermally stimulated exoelectron emission from solid Xe / I.V. Khyzhniy, O.N. Grigorashchenko, A.N. Ponomaryov, E.V. Savchenko, V.E. Bondybey // Физика низких температур. — 2007. — Т. 33, № 6-7. — С. 701-704. — Бібліогр.: 11 назв. — рос. |
series |
Физика низких температур |
work_keys_str_mv |
AT khyzhniyiv thermallystimulatedexoelectronemissionfromsolidxe AT grigorashchenkoon thermallystimulatedexoelectronemissionfromsolidxe AT ponomaryovan thermallystimulatedexoelectronemissionfromsolidxe AT savchenkoev thermallystimulatedexoelectronemissionfromsolidxe AT bondybeyve thermallystimulatedexoelectronemissionfromsolidxe |
first_indexed |
2023-10-18T20:40:19Z |
last_indexed |
2023-10-18T20:40:19Z |
_version_ |
1796150809900089344 |