Thermoactivation spectroscopy of solid Ar doped with N₂
A new modification of low-temperature activation spectroscopy technique for real-time correlated study of relaxation processes in cryogenic solids was developed. This enabled us to measure simultaneously thermally stimulated exoelectron emission (TSEE) and spectrally resolved thermally stimulated...
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Дата: | 2007 |
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Автори: | , , , , , |
Формат: | Стаття |
Мова: | English |
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Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
2007
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Назва видання: | Физика низких температур |
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Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/121793 |
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Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
Цитувати: | Thermoactivation spectroscopy of solid Ar doped with N₂ / A.N. Ponomaryov, E.V. Savchenko, G.B. Gumenchuk, I.V. Khizhniy, M. Frankowski, V.E. Bondybey // Физика низких температур. — 2007. — Т. 33, № 6-7. — С. 705-710. — Бібліогр.: 8 назв. — англ. |
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irk-123456789-1217932017-06-17T03:03:16Z Thermoactivation spectroscopy of solid Ar doped with N₂ Ponomaryov, A.N. Savchenko, E.V. Gumenchuk, G.B. Khizhniy, I.V. Frankowski, M. Bondybey, V.E. Electronic Processes in Cryocrystals A new modification of low-temperature activation spectroscopy technique for real-time correlated study of relaxation processes in cryogenic solids was developed. This enabled us to measure simultaneously thermally stimulated exoelectron emission (TSEE) and spectrally resolved thermally stimulated luminescence (TSL) in the range from 200 to 1100 nm. This paper presents the results on TSL and TSEE from solid Ar doped with N₂ exposed to irradiation by low-energy electron beam (500 eV) during deposition. The TSEE and TSL yields were measured at the heating rate of 3.2 K/min. The emissions of molecular (A³Σu⁺ → X¹Σg⁺ transition) and atomic (²D → ⁴S transition) nitrogen in the TSL spectra and their temperature behavior were studied. Drastic changes in the intensity distribution of the molecular progression were observed with temperature rise. In low-temperature range «hot» vibrationally unrelaxed transitions were detected in contrast to «cold» vibrationally relaxed transitions observed in «high» temperature TSL. The mechanisms of the processes resulting in TSL in whole temperature range of Ar solid occurrence are suggested. 2007 Article Thermoactivation spectroscopy of solid Ar doped with N₂ / A.N. Ponomaryov, E.V. Savchenko, G.B. Gumenchuk, I.V. Khizhniy, M. Frankowski, V.E. Bondybey // Физика низких температур. — 2007. — Т. 33, № 6-7. — С. 705-710. — Бібліогр.: 8 назв. — англ. 0132-6414 PACS: 78.55.–m; 78.60.–b http://dspace.nbuv.gov.ua/handle/123456789/121793 en Физика низких температур Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України |
institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
collection |
DSpace DC |
language |
English |
topic |
Electronic Processes in Cryocrystals Electronic Processes in Cryocrystals |
spellingShingle |
Electronic Processes in Cryocrystals Electronic Processes in Cryocrystals Ponomaryov, A.N. Savchenko, E.V. Gumenchuk, G.B. Khizhniy, I.V. Frankowski, M. Bondybey, V.E. Thermoactivation spectroscopy of solid Ar doped with N₂ Физика низких температур |
description |
A new modification of low-temperature activation spectroscopy technique for real-time correlated study
of relaxation processes in cryogenic solids was developed. This enabled us to measure simultaneously thermally
stimulated exoelectron emission (TSEE) and spectrally resolved thermally stimulated luminescence
(TSL) in the range from 200 to 1100 nm. This paper presents the results on TSL and TSEE from solid Ar
doped with N₂ exposed to irradiation by low-energy electron beam (500 eV) during deposition. The TSEE
and TSL yields were measured at the heating rate of 3.2 K/min. The emissions of molecular (A³Σu⁺ → X¹Σg⁺ transition) and atomic (²D → ⁴S transition) nitrogen in the TSL spectra and their temperature behavior were
studied. Drastic changes in the intensity distribution of the molecular progression were observed with temperature
rise. In low-temperature range «hot» vibrationally unrelaxed transitions were detected in contrast
to «cold» vibrationally relaxed transitions observed in «high» temperature TSL. The mechanisms of the processes
resulting in TSL in whole temperature range of Ar solid occurrence are suggested. |
format |
Article |
author |
Ponomaryov, A.N. Savchenko, E.V. Gumenchuk, G.B. Khizhniy, I.V. Frankowski, M. Bondybey, V.E. |
author_facet |
Ponomaryov, A.N. Savchenko, E.V. Gumenchuk, G.B. Khizhniy, I.V. Frankowski, M. Bondybey, V.E. |
author_sort |
Ponomaryov, A.N. |
title |
Thermoactivation spectroscopy of solid Ar doped with N₂ |
title_short |
Thermoactivation spectroscopy of solid Ar doped with N₂ |
title_full |
Thermoactivation spectroscopy of solid Ar doped with N₂ |
title_fullStr |
Thermoactivation spectroscopy of solid Ar doped with N₂ |
title_full_unstemmed |
Thermoactivation spectroscopy of solid Ar doped with N₂ |
title_sort |
thermoactivation spectroscopy of solid ar doped with n₂ |
publisher |
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України |
publishDate |
2007 |
topic_facet |
Electronic Processes in Cryocrystals |
url |
http://dspace.nbuv.gov.ua/handle/123456789/121793 |
citation_txt |
Thermoactivation spectroscopy of solid Ar doped with N₂ / A.N. Ponomaryov, E.V. Savchenko, G.B. Gumenchuk, I.V. Khizhniy, M. Frankowski, V.E. Bondybey // Физика низких температур. — 2007. — Т. 33, № 6-7. — С. 705-710. — Бібліогр.: 8 назв. — англ. |
series |
Физика низких температур |
work_keys_str_mv |
AT ponomaryovan thermoactivationspectroscopyofsolidardopedwithn2 AT savchenkoev thermoactivationspectroscopyofsolidardopedwithn2 AT gumenchukgb thermoactivationspectroscopyofsolidardopedwithn2 AT khizhniyiv thermoactivationspectroscopyofsolidardopedwithn2 AT frankowskim thermoactivationspectroscopyofsolidardopedwithn2 AT bondybeyve thermoactivationspectroscopyofsolidardopedwithn2 |
first_indexed |
2023-10-18T20:40:19Z |
last_indexed |
2023-10-18T20:40:19Z |
_version_ |
1796150810003898368 |