X-Ray fluorescence determination of impurity traces using a secondary emitter and a solid-state detector
Збережено в:
| Дата: | 2010 |
|---|---|
| Автори: | , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
НТК «Інститут монокристалів» НАН України
2010
|
| Назва видання: | Functional Materials |
| Теми: | |
| Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/134203 |
| Теги: |
Додати тег
Немає тегів, Будьте першим, хто поставить тег для цього запису!
|
| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | X-Ray fluorescence determination of impurity traces using a secondary emitter and a solid-state detector / I.F. Mikhailov, A.A. Baturin, L.P. Fomina // Functional Materials. — 2010. — Т. 17, № 1. — С. 127-130. — Бібліогр.: 2 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
irk-123456789-134203 |
|---|---|
| record_format |
dspace |
| spelling |
irk-123456789-1342032018-06-13T03:05:28Z X-Ray fluorescence determination of impurity traces using a secondary emitter and a solid-state detector Mikhailov, I.F. Baturin, A.A. Fomina, L.P. Technology 2010 Article X-Ray fluorescence determination of impurity traces using a secondary emitter and a solid-state detector / I.F. Mikhailov, A.A. Baturin, L.P. Fomina // Functional Materials. — 2010. — Т. 17, № 1. — С. 127-130. — Бібліогр.: 2 назв. — англ. 1027-5495 http://dspace.nbuv.gov.ua/handle/123456789/134203 en Functional Materials НТК «Інститут монокристалів» НАН України |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| language |
English |
| topic |
Technology Technology |
| spellingShingle |
Technology Technology Mikhailov, I.F. Baturin, A.A. Fomina, L.P. X-Ray fluorescence determination of impurity traces using a secondary emitter and a solid-state detector Functional Materials |
| format |
Article |
| author |
Mikhailov, I.F. Baturin, A.A. Fomina, L.P. |
| author_facet |
Mikhailov, I.F. Baturin, A.A. Fomina, L.P. |
| author_sort |
Mikhailov, I.F. |
| title |
X-Ray fluorescence determination of impurity traces using a secondary emitter and a solid-state detector |
| title_short |
X-Ray fluorescence determination of impurity traces using a secondary emitter and a solid-state detector |
| title_full |
X-Ray fluorescence determination of impurity traces using a secondary emitter and a solid-state detector |
| title_fullStr |
X-Ray fluorescence determination of impurity traces using a secondary emitter and a solid-state detector |
| title_full_unstemmed |
X-Ray fluorescence determination of impurity traces using a secondary emitter and a solid-state detector |
| title_sort |
x-ray fluorescence determination of impurity traces using a secondary emitter and a solid-state detector |
| publisher |
НТК «Інститут монокристалів» НАН України |
| publishDate |
2010 |
| topic_facet |
Technology |
| url |
http://dspace.nbuv.gov.ua/handle/123456789/134203 |
| citation_txt |
X-Ray fluorescence determination of impurity traces using a secondary emitter and a solid-state detector / I.F. Mikhailov, A.A. Baturin, L.P. Fomina // Functional Materials. — 2010. — Т. 17, № 1. — С. 127-130. — Бібліогр.: 2 назв. — англ. |
| series |
Functional Materials |
| work_keys_str_mv |
AT mikhailovif xrayfluorescencedeterminationofimpuritytracesusingasecondaryemitterandasolidstatedetector AT baturinaa xrayfluorescencedeterminationofimpuritytracesusingasecondaryemitterandasolidstatedetector AT fominalp xrayfluorescencedeterminationofimpuritytracesusingasecondaryemitterandasolidstatedetector |
| first_indexed |
2023-10-18T21:07:52Z |
| last_indexed |
2023-10-18T21:07:52Z |
| _version_ |
1796151999692013568 |