Increasing the sensitivity of X-ray fluorescent scheme with secondary radiator using the initial spectrum filtration

Optimization of the primary filter in the scheme with fluorescent re-radiator was carried out using the minimum detection limit criterion Cmin. It was established experimentally, that the filtration provides three-fourfold increase for the contrast and 70 % gain for the detection limit. For All trac...

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Бібліографічні деталі
Дата:2012
Автори: Mikhailov, I.F., Baturin, A.A., Mikhailov, A.I., Borisova, S.S.
Формат: Стаття
Мова:English
Опубліковано: НТК «Інститут монокристалів» НАН України 2012
Назва видання:Functional Materials
Теми:
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/135279
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Increasing the sensitivity of X-ray fluorescent scheme with secondary radiator using the initial spectrum filtration / I.F. Mikhailov, A.A. Baturin, A.I. Mikhailov, S.S. Borisova // Functional Materials. — 2012. — Т. 19, № 1. — С. 126-129. — Бібліогр.: 6 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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spelling irk-123456789-1352792018-06-15T03:05:06Z Increasing the sensitivity of X-ray fluorescent scheme with secondary radiator using the initial spectrum filtration Mikhailov, I.F. Baturin, A.A. Mikhailov, A.I. Borisova, S.S. Devices and instruments Optimization of the primary filter in the scheme with fluorescent re-radiator was carried out using the minimum detection limit criterion Cmin. It was established experimentally, that the filtration provides three-fourfold increase for the contrast and 70 % gain for the detection limit. For All trace impurities in ion-exchange resins, the achieved sensitivity about 1 ppm does not yield to values obtained in the complex Barkla scheme using polarized radiation. 2012 Article Increasing the sensitivity of X-ray fluorescent scheme with secondary radiator using the initial spectrum filtration / I.F. Mikhailov, A.A. Baturin, A.I. Mikhailov, S.S. Borisova // Functional Materials. — 2012. — Т. 19, № 1. — С. 126-129. — Бібліогр.: 6 назв. — англ. 1027-5495 http://dspace.nbuv.gov.ua/handle/123456789/135279 en Functional Materials НТК «Інститут монокристалів» НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
topic Devices and instruments
Devices and instruments
spellingShingle Devices and instruments
Devices and instruments
Mikhailov, I.F.
Baturin, A.A.
Mikhailov, A.I.
Borisova, S.S.
Increasing the sensitivity of X-ray fluorescent scheme with secondary radiator using the initial spectrum filtration
Functional Materials
description Optimization of the primary filter in the scheme with fluorescent re-radiator was carried out using the minimum detection limit criterion Cmin. It was established experimentally, that the filtration provides three-fourfold increase for the contrast and 70 % gain for the detection limit. For All trace impurities in ion-exchange resins, the achieved sensitivity about 1 ppm does not yield to values obtained in the complex Barkla scheme using polarized radiation.
format Article
author Mikhailov, I.F.
Baturin, A.A.
Mikhailov, A.I.
Borisova, S.S.
author_facet Mikhailov, I.F.
Baturin, A.A.
Mikhailov, A.I.
Borisova, S.S.
author_sort Mikhailov, I.F.
title Increasing the sensitivity of X-ray fluorescent scheme with secondary radiator using the initial spectrum filtration
title_short Increasing the sensitivity of X-ray fluorescent scheme with secondary radiator using the initial spectrum filtration
title_full Increasing the sensitivity of X-ray fluorescent scheme with secondary radiator using the initial spectrum filtration
title_fullStr Increasing the sensitivity of X-ray fluorescent scheme with secondary radiator using the initial spectrum filtration
title_full_unstemmed Increasing the sensitivity of X-ray fluorescent scheme with secondary radiator using the initial spectrum filtration
title_sort increasing the sensitivity of x-ray fluorescent scheme with secondary radiator using the initial spectrum filtration
publisher НТК «Інститут монокристалів» НАН України
publishDate 2012
topic_facet Devices and instruments
url http://dspace.nbuv.gov.ua/handle/123456789/135279
citation_txt Increasing the sensitivity of X-ray fluorescent scheme with secondary radiator using the initial spectrum filtration / I.F. Mikhailov, A.A. Baturin, A.I. Mikhailov, S.S. Borisova // Functional Materials. — 2012. — Т. 19, № 1. — С. 126-129. — Бібліогр.: 6 назв. — англ.
series Functional Materials
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first_indexed 2023-10-18T21:08:41Z
last_indexed 2023-10-18T21:08:41Z
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