Determination of chemical composition of implanted nanolayers by analysis of their optical properties

The method for determining the composition of nanolayer from the experimental spectra of optical transmission and reflection was developed. Modeling of the optical properties of the composite was carried out on the basis of Bruggeman’s effective medium theory. This method was applied to samples of s...

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Збережено в:
Бібліографічні деталі
Дата:2012
Автори: Mysiura, I.N., Girka, I.O., Gritsyna, V.T.
Формат: Стаття
Мова:English
Опубліковано: НТК «Інститут монокристалів» НАН України 2012
Назва видання:Functional Materials
Теми:
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/135297
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Determination of chemical composition of implanted nanolayers by analysis of their optical properties / I.N. Mysiura, I.O. Girka, V.T. Gritsyna // Functional Materials. — 2012. — Т. 19, № 2. — С. 251-255. — Бібліогр.: 9 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
Опис
Резюме:The method for determining the composition of nanolayer from the experimental spectra of optical transmission and reflection was developed. Modeling of the optical properties of the composite was carried out on the basis of Bruggeman’s effective medium theory. This method was applied to samples of silica glass implanted with Cu⁻ ion beam of 60 keV energy and at various current densities. The structure and thickness of nanolayer are determined using transmission electron microscopy method. On the basis of the optical spectra analysis the range of photons energy (3.5 ÷ 4.5 eV) was selected. Composition of the implanted layers in the form of volume concentrations of it’s components (copper, cuprous oxide (Cu₂O) and substrate material) were obtained.