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Peculiarities of the PbTe nano-islet formation on BaF₂ substrate at "hot wall" epitaxy method investigated by atomic force microscopy

Peculiarities of PbTe nano-islet films formation on BaF₂ (111) fresh cleavages by hot wall epitaxy deposition have been investigated using atomic force microscopy. It has been shown that various growth mechanisms could be realized by selection of proper temperature regimes in the growth chamber: gro...

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Main Authors: Sheremeta, T.I., Prokopenko, I.V., Lytvyn, P.M., Lytvyn, O.S., Vodop`yanov, V.M., Bakhtinov, A.P., Shyn`ko, E.I.
Format: Article
Language:English
Published: НТК «Інститут монокристалів» НАН України 2007
Series:Functional Materials
Online Access:http://dspace.nbuv.gov.ua/handle/123456789/136447
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spelling irk-123456789-1364472018-06-18T03:05:19Z Peculiarities of the PbTe nano-islet formation on BaF₂ substrate at "hot wall" epitaxy method investigated by atomic force microscopy Sheremeta, T.I. Prokopenko, I.V. Lytvyn, P.M. Lytvyn, O.S. Vodop`yanov, V.M. Bakhtinov, A.P. Shyn`ko, E.I. Peculiarities of PbTe nano-islet films formation on BaF₂ (111) fresh cleavages by hot wall epitaxy deposition have been investigated using atomic force microscopy. It has been shown that various growth mechanisms could be realized by selection of proper temperature regimes in the growth chamber: growth of three-dimensional nano-islets (VolmerWeber mechanism) and simultaneous growth of 2D layers (by Frank-van der Merwe) with 3D islets. The nano-islet shape and size can be controlled by temperature regimes and total amount of deposited material. 2007 Article Peculiarities of the PbTe nano-islet formation on BaF₂ substrate at "hot wall" epitaxy method investigated by atomic force microscopy / T.I. Sheremeta, I.V. Prokopenko, P.M. Lytvyn, O.S. Lytvyn, V.M. Vodop`yanov, A.P. Bakhtinov, E.I. Shyn`ko // Functional Materials. — 2007. — Т. 14, № 1. — С. 86-91. — Бібліогр.: 9 назв. — англ. 1027-5495 http://dspace.nbuv.gov.ua/handle/123456789/136447 en Functional Materials НТК «Інститут монокристалів» НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
description Peculiarities of PbTe nano-islet films formation on BaF₂ (111) fresh cleavages by hot wall epitaxy deposition have been investigated using atomic force microscopy. It has been shown that various growth mechanisms could be realized by selection of proper temperature regimes in the growth chamber: growth of three-dimensional nano-islets (VolmerWeber mechanism) and simultaneous growth of 2D layers (by Frank-van der Merwe) with 3D islets. The nano-islet shape and size can be controlled by temperature regimes and total amount of deposited material.
format Article
author Sheremeta, T.I.
Prokopenko, I.V.
Lytvyn, P.M.
Lytvyn, O.S.
Vodop`yanov, V.M.
Bakhtinov, A.P.
Shyn`ko, E.I.
spellingShingle Sheremeta, T.I.
Prokopenko, I.V.
Lytvyn, P.M.
Lytvyn, O.S.
Vodop`yanov, V.M.
Bakhtinov, A.P.
Shyn`ko, E.I.
Peculiarities of the PbTe nano-islet formation on BaF₂ substrate at "hot wall" epitaxy method investigated by atomic force microscopy
Functional Materials
author_facet Sheremeta, T.I.
Prokopenko, I.V.
Lytvyn, P.M.
Lytvyn, O.S.
Vodop`yanov, V.M.
Bakhtinov, A.P.
Shyn`ko, E.I.
author_sort Sheremeta, T.I.
title Peculiarities of the PbTe nano-islet formation on BaF₂ substrate at "hot wall" epitaxy method investigated by atomic force microscopy
title_short Peculiarities of the PbTe nano-islet formation on BaF₂ substrate at "hot wall" epitaxy method investigated by atomic force microscopy
title_full Peculiarities of the PbTe nano-islet formation on BaF₂ substrate at "hot wall" epitaxy method investigated by atomic force microscopy
title_fullStr Peculiarities of the PbTe nano-islet formation on BaF₂ substrate at "hot wall" epitaxy method investigated by atomic force microscopy
title_full_unstemmed Peculiarities of the PbTe nano-islet formation on BaF₂ substrate at "hot wall" epitaxy method investigated by atomic force microscopy
title_sort peculiarities of the pbte nano-islet formation on baf₂ substrate at "hot wall" epitaxy method investigated by atomic force microscopy
publisher НТК «Інститут монокристалів» НАН України
publishDate 2007
url http://dspace.nbuv.gov.ua/handle/123456789/136447
citation_txt Peculiarities of the PbTe nano-islet formation on BaF₂ substrate at "hot wall" epitaxy method investigated by atomic force microscopy / T.I. Sheremeta, I.V. Prokopenko, P.M. Lytvyn, O.S. Lytvyn, V.M. Vodop`yanov, A.P. Bakhtinov, E.I. Shyn`ko // Functional Materials. — 2007. — Т. 14, № 1. — С. 86-91. — Бібліогр.: 9 назв. — англ.
series Functional Materials
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