Self-diffraction effect observation and recording the holographic one-dimensional and two-dimensional gratings in thin photosensitive films
A setup for observation of the nonlinear self-diffraction effect has been described. A semiconductor laser (P≈50 mW, λ≈660 nm) is used as a radiation source. The laser beam is divided into two beams by a Wollaston prism, the beams pass through a polarizer and positive lens, then they intersect and c...
Збережено в:
Дата: | 2007 |
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Автори: | , , , |
Формат: | Стаття |
Мова: | English |
Опубліковано: |
НТК «Інститут монокристалів» НАН України
2007
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Назва видання: | Functional Materials |
Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/136527 |
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Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
Цитувати: | Self-diffraction effect observation and recording the holographic one-dimensional and two-dimensional gratings in thin photosensitive films / L.A. Ageev, K.S. Beloshenko, E.D. Makovetsky, V.K. Miloslavsky // Functional Materials. — 2007. — Т. 14, № 3. — С. 290-294. — Бібліогр.: 7 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of UkraineРезюме: | A setup for observation of the nonlinear self-diffraction effect has been described. A semiconductor laser (P≈50 mW, λ≈660 nm) is used as a radiation source. The laser beam is divided into two beams by a Wollaston prism, the beams pass through a polarizer and positive lens, then they intersect and create an interference. Using a microscope, the interference may be observed in an increased scale on a remote screen. The interference is registered in a thin photosensitive As₂S₃—Ag film prepared by vacuum evaporation. We have shown an opportunity to observe the self-diffraction from recorded diffraction grating with linear grooves and from two-dimensional grating induced as a result of second exposure after turning the convergence plane of the interfering beams by 90°. |
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