Structural investigation of As-Se chalcogenide thin films with different compositions: formation, characterization and peculiarities of volume and near-surface nanolayers
As₂₀Se₈₀, As₄₀Se₆₀ and As₅₀Se₅₀ films were studied by Raman spectroscopy in order to examine the local- and medium-range order of the structure. In addition, X-ray photoelectron, Raman and surface enhanced Raman spectroscopy were used to characterize the structural peculiarities at the top surface o...
Збережено в:
| Дата: | 2017 |
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| Автори: | , , , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
НТК «Інститут монокристалів» НАН України
2017
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| Назва видання: | Functional Materials |
| Теми: | |
| Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/136885 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Structural investigation of As-Se chalcogenide thin films with different compositions: formation, characterization and peculiarities of volume and near-surface nanolayers / O. Kondrat, R. Holomb, V. Mitsa, M. Veres, N. Tsud // Functional Materials. — 2017. — Т. 24, № 4. — С. 547-554. — Бібліогр.: 32 назв. — англ. |