Contact electrodeposition of CdTe thin films
The effect of contact electrodeposition conditions on the impurity content in CdTe films has been studied. Stoichiometric single-phase CdTe layers of cubic modification have been obtained. The films are not texturized, and are characterized by the coherent-scattering region size of about 30 nm and t...
Збережено в:
| Дата: | 2009 |
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| Автори: | , , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
НТК «Інститут монокристалів» НАН України
2009
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| Назва видання: | Functional Materials |
| Теми: | |
| Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/137736 |
| Теги: |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Contact electrodeposition of CdTe thin films // N.P. Klochko, N.D. Volkova, M.M. Kharchenko, V.R. Kopach // Functional Materials. — 2009. — Т. 16, № 2. — С. 190-191. — Бібліогр.: 5 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| Резюме: | The effect of contact electrodeposition conditions on the impurity content in CdTe films has been studied. Stoichiometric single-phase CdTe layers of cubic modification have been obtained. The films are not texturized, and are characterized by the coherent-scattering region size of about 30 nm and the relative micro-strain values of about 5·10⁻³. |
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