Piezoresistive properties of boron-doped silicon whiskers at cryogenic temperatures

• Дата: 2004
• Автори: Druzhinin, A.A., Maryamova, I.I., Pavlovskyy, I.V., Palewski, T.
• Формат: Стаття
• Мова: English
• Опубліковано: НТК «Інститут монокристалів» НАН України 2004
• Назва видання: Functional Materials
• Онлайн доступ: http://dspace.nbuv.gov.ua/handle/123456789/138789
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Цитувати: Piezoresistive properties of boron-doped silicon whiskers at cryogenic temperatures/ A.A. Druzhinin, I.I. Maryamova, I.V. Pavlovskyy, T. Palewski// Functional Materials. — 2004. — Т. 11, № 2. — С. 268-272. — Бібліогр.: 10 назв. — англ.

Piezoresistive properties of boron-doped p-type silicon whiskers in temperature range of 1.7 to 300 K were studied. The giant piezoresistance was observed in p-Si whiskers in the vicinity of metal-insulator transition at helium temperatures. The gauge factor dependence on impurity concentration and temperature has been investigated. The extremely high gauge factor 5.7-105 at 4.2 K has been found in moderately doped silicon microcrystals with boron concentration 3-1018 cm-3 in the vicinity of metal-insulator transition at the insulating side. The possibility of application of giant piezoresistance to develop high-sensitive mechanical sensors operating, at cryogenic temperatures is discussed.