X-ray spectroscopic study of structural isotypism in Me₂Si silicides

• Дата: 2004
• Автори: Gel, P.V., Yushchenko, A.V., Nedybalyuk, A.F., Sakhno, V.M.
• Формат: Стаття
• Мова: English
• Опубліковано: НТК «Інститут монокристалів» НАН України 2004
• Назва видання: Functional Materials
• Онлайн доступ: http://dspace.nbuv.gov.ua/handle/123456789/138795
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Цитувати: X-ray spectroscopic study of structural isotypism in Me₂Si silicides / P.V. Gel, A.V. Yushchenko, A.F. Nedybalyuk, V.M. Sakhno // Functional Materials. — 2004. — Т. 11, № 2. — С. 389-392. — Бібліогр.: 9 назв. — англ.

Basing on consideration of the shape, width, energy position, and integral intensity of X-ray spectra of all series as well as of photoemission quantum yield, an attempt has been made to explain the isotypism nature for silicides of transition metals belonging to the beginning and end of the 1st lar...