Analysis of low-temperature relaxation resonances in materials containing defects
A theory has been advanced providing an adequate description of thermal-activated relaxation resonances of various physical origins in defect-containing materials. The algorithm has been proposed for processing the temperature spectra of absorption and suscep -tibility defect to determine the relaxa...
Збережено в:
| Дата: | 2004 |
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| Автори: | , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
НТК «Інститут монокристалів» НАН України
2004
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| Назва видання: | Functional Materials |
| Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/138820 |
| Теги: |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Analysis of low-temperature relaxation resonances in materials containing defects / V.D. Natsik, Yu.A. Semerenko // Functional Materials. — 2004. — Т. 11, № 2. — С. 327-333. — Бібліогр.: 6 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| Резюме: | A theory has been advanced providing an adequate description of thermal-activated relaxation resonances of various physical origins in defect-containing materials. The algorithm has been proposed for processing the temperature spectra of absorption and suscep -tibility defect to determine the relaxation process activation parameters. |
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