Growing of GaₓIn₁-ₓSb single crystals by Czochralski technique

The effective distribution coefficients for Ga in Gaₓln₁-ₓSb single crystals (х ≤ 0.2) have been calculated according the Ostrogorsky-Mueller model taking into account the experimental data. The growing procedure of Gaₓln₁-ₓSb single crystals using the Czochralski technique has been...

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Збережено в:
Бібліографічні деталі
Дата:2005
Автори: Kozhemyakin, G.N., Ruban, R.V.
Формат: Стаття
Мова:English
Опубліковано: НТК «Інститут монокристалів» НАН України 2005
Назва видання:Functional Materials
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/138949
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Growing of GaₓIn₁-ₓSb single crystals by Czochralski technique / G.N. Kozhemyakin, R.V. Ruban // Functional Materials. — 2005. — Т. 12, № 4. — С. 762-764. — Бібліогр.: 5 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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Резюме:The effective distribution coefficients for Ga in Gaₓln₁-ₓSb single crystals (х ≤ 0.2) have been calculated according the Ostrogorsky-Mueller model taking into account the experimental data. The growing procedure of Gaₓln₁-ₓSb single crystals using the Czochralski technique has been developed and the crystals up to 18 mm in diameter have been grown. The influence of annealing on the crack formation in Gaₓln₁-ₓSb single crystals after cutting thereof has been studied. The crystal annealing at 170℃ for 10-12 h has been found to reduce the number of cracks longer than 0.2 mm.