Statistical sampling and feature selection for epilepsy pattern recognition

Epilepsy is one of the most common neurological diseases that has broad spectrum of debilitating medical and social consequences. The automatic forecasting and detecting systems are vitally important, since they allow patients to avoid dangerous activities in advance of the seizure. We present som...

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Збережено в:
Бібліографічні деталі
Дата:2020
Автори: Gaidar, V.O., Sudakov, O.O.
Формат: Стаття
Мова:English
Опубліковано: Видавничий дім "Академперіодика" НАН України 2020
Назва видання:Доповіді НАН України
Теми:
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/170409
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Statistical sampling and feature selection for epilepsy pattern recognition / V.O. Gaidar, O.O. Sudakov // Доповіді Національної академії наук України. — 2020. — № 4. — С. 53-56. — Бібліогр.: 4 назв. — англ.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
Опис
Резюме:Epilepsy is one of the most common neurological diseases that has broad spectrum of debilitating medical and social consequences. The automatic forecasting and detecting systems are vitally important, since they allow patients to avoid dangerous activities in advance of the seizure. We present some methods of feature extraction and selection for detecting the epileptiform activity in electroencephalography signals, based on the processing of a non-stationary signal. The proposed approach is based on the application of the Discrete Wavelet Transform (DWT) and signal processing techniques in order to create the feature vector. Afterwards, the principal component analysis and support vector machine techniques are used in order to reduce the dimensionality of the feature vector.