Dielectric RF resonators with open boundaries for studying radiation effect on electrodynamic characteristics of solid dielectrics
The use of dielectric materials in the charged particles accelerators requires investigation of changes in the electrodynamic properties of these materials under the influence of ionizing radiation. First of all it is necessary to study the effect of radiation on the complex dielectric permittivity...
Збережено в:
Дата: | 2020 |
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Автори: | , , , , , |
Формат: | Стаття |
Мова: | English |
Опубліковано: |
Національний науковий центр «Харківський фізико-технічний інститут» НАН України
2020
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Назва видання: | Вопросы атомной науки и техники |
Теми: | |
Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/194497 |
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Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
Цитувати: | Dielectric RF resonators with open boundaries for studying radiation effect on electrodynamic characteristics of solid dielectrics / V.A. Kushnir, K.Yu. Kramarenko, V.V. Mytrochenko, O.D. Nikitina, S.A. Perezhogin, L.I. Selivanov // Problems of atomic science and tecnology. — 2020. — № 3. — С. 39-44. — Бібліогр.: 11 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of UkraineРезюме: | The use of dielectric materials in the charged particles accelerators requires investigation of changes in the electrodynamic properties of these materials under the influence of ionizing radiation. First of all it is necessary to study the effect of radiation on the complex dielectric permittivity (ε and tgδ) of these materials. The actual task is to measure very small relative changes in the dielectric constant, for example, Δε/ε∼10⁻⁴. Such accuracy can be provided by resonator methods. In the present work results of theoretical and experimental research of microwave dielectric resonators with open boundaries are given. It is shown, that they can be used to measure dielectrics during irradiation by gamma radiation or charged particles beam. The analysis of factors that affect the accuracy of measurements is carried out. |
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