Secondary electron emission induced by α-particles from Mg-MgO layers

• Дата: 2019
• Автори: Zhurenko, V.P., Kononenko, S.I., Mahotka, I.S., Kalantaryan, O.V., Mysiura, I.M., Avotin, S.S., Rokhmanov, N.Ya.
• Формат: Стаття
• Мова: English
• Опубліковано: Національний науковий центр «Харківський фізико-технічний інститут» НАН України 2019
• Назва видання: Вопросы атомной науки и техники
• Теми: Applications and technologies
• Онлайн доступ: http://dspace.nbuv.gov.ua/handle/123456789/195189
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Цитувати: Secondary electron emission induced by α-particles from Mg-MgO layers / V.P. Zhurenko, S.I. Kononenko, I.S. Mahotka, O.V. Kalantaryan, I.M. Mysiura, S.S. Avotin, N.Ya. Rokhmanov // Problems of atomic science and technology. — 2019. — № 4. — С. 207-210. — Бібліогр.: 20 назв. — англ.

The paper presents the results of experimental study of forward and backward electron emission induced by α- particles from the deposited film of magnesium. It was shown that during the deposition of magnesium in residual gas atmosphere the deposited film contained a large amount of MgO component, which makes it possible to consider the resulting structure as Mg-MgO. The presence of magnesium oxide on the surface of the target and the collector leads to the fact that the previously obtained dependence of the ratio of forward and backward electron yields on specific energy loss of the ion for various metals is not applicable in the case of deposited magnesium. The differences are explained by the specificity of the emission from magnesium in the presence of a significant amount of MgO. The results obtained can be used to detect MgO on the surface of a magnesium substrate. It was shown the differences in the experimental data for the bulk magnesium collector and the collector with deposited magnesium layer.