Application of cathodoluminescence for on-line monitoring of regime of an industrial electron accelerator

Continuous monitoring of critical parameters of an industrial electron accelerator provides quality of product processing. For that purpose, the methods of contact-free diagnostics of processing regime are developed. One of them is based on application of a wide-aperture stack-monitor for on-line me...

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Збережено в:
Бібліографічні деталі
Дата:2019
Автори: Pomatsalyuk, R.I., Romanovsky, S.K., Shevchenko, V.A., Tenishev, A.Eh., Titov, V.Yu., Titov, D.V., Uvarov, V.L., Zakharchenko, A.A.
Формат: Стаття
Мова:English
Опубліковано: Національний науковий центр «Харківський фізико-технічний інститут» НАН України 2019
Назва видання:Вопросы атомной науки и техники
Теми:
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/195467
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Application of cathodoluminescence for on-line monitoring of regime of an industrial electron accelerator / R.I. Pomatsalyuk, S.K. Romanovsky, V.A. Shevchenko, A.Eh. Tenishev, V.Yu. Titov, D.V. Titov, V.L. Uvarov, A.A. Zakharchenko // Problems of atomic science and technology. — 2019. — № 6. — С. 168-171. — Бібліогр.: 9 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
Опис
Резюме:Continuous monitoring of critical parameters of an industrial electron accelerator provides quality of product processing. For that purpose, the methods of contact-free diagnostics of processing regime are developed. One of them is based on application of a wide-aperture stack-monitor for on-line measurement of beam current, electron energy, and also the mean absorbed dose over the plain of beam scanning in an irradiated object [1]. In the work, the conditions of application of cathodoluminescence (CL), accompanied action of accelerated electrons on amorphous dielectrics, for adjustment of the stack-monitor, and also for measuring in on-line mode the dose in a point of control as well as of distribution of the electron flux density on the surface of the object, is studied. It is shown, that titanium dioxide, keeping the radiation-optical yield at an accumulated dose of up to 4 MGy, can be considered as a promising material for manufacturing of CL detector.