Formation and monitoring of secondary X-ray radiation under product processing with electron beam

• Дата: 2021
• Автори: Pomatsalyuk, R.I., Shevchenko, V.A., Titov, D.V., Tenishev, A.Eh., Uvarov, V.L., Zakharchenko, A.A., Vereshchaka, V.N.
• Формат: Стаття
• Мова: English
• Опубліковано: Національний науковий центр «Харківський фізико-технічний інститут» НАН України 2021
• Назва видання: Вопросы атомной науки и техники
• Теми: Application of accelerators in radiation technologies
• Онлайн доступ: http://dspace.nbuv.gov.ua/handle/123456789/195811
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Цитувати: Formation and monitoring of secondary X-ray radiation under product processing with electron beam / R.I. Pomatsalyuk, V.A. Shevchenko D.V. Titov, A.Eh. Tenishev, V.L. Uvarov, A.A. Zakharchenko, V.N. Vereshchaka // Problems of Atomic Science and Technology. — 2021. — № 6. — С. 201-205. — Бібліогр.: 12 назв. — англ.

When conducting an industrial radiation processes at an electron accelerator, a part of the beam energy is transformed into bremsstrahlung radiation. In such a way, the mixed e,X-radiation is formed in the area behind an irradiated object. The intensity of the electron and photon components in the radiation is determined by the energy and power of the primary electron beam, as well as by the parameters of the object and devices located behind it. In paper, the characteristics of the e,X-radiation accompanying the product processing by a scanning electron beam with energy 8…12 MeV at a LU-10 Linac of NSC KIPT are studied. The conditions for obtaining a source of secondary X-rays in the state of electronic equilibrium, as well as its monitoring using an extended free-air ionization chamber are explored. Such an extra-source of radiation can be used for carrying out various non-commercial programs like radiation tests, sanitization of archival materials and cultural heritage objects, etc.