Multi-channel electronics for secondary emission grid profile monitor of TTF linac
According to theTTF beam experimental program, a measurement of the time dependence of the energy spread within the bunch train should be done by means of a standard device for profile measurements, that is Secondary Emission Grid (SEMG). SEMG on the high-energy TTF beam is placed in the focal pla...
Збережено в:
| Дата: | 2004 |
|---|---|
| Автори: | , , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Національний науковий центр «Харківський фізико-технічний інститут» НАН України
2004
|
| Назва видання: | Вопросы атомной науки и техники |
| Теми: | |
| Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/78954 |
| Теги: |
Додати тег
Немає тегів, Будьте першим, хто поставить тег для цього запису!
|
| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Multi-channel electronics for secondary emission grid profile monitor of TTF linac / P. Reingardt-Nikoulin, V. Gaidash, A. Mirzojan, A. Novikov-Borodin // Вопросы атомной науки и техники. — 2004. — № 1. — С. 97-100. — Бібліогр.: 2 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| Резюме: | According to theTTF beam experimental program, a measurement of the time dependence of the energy spread
within the bunch train should be done by means of a standard device for profile measurements, that is Secondary
Emission Grid (SEMG). SEMG on the high-energy TTF beam is placed in the focal plane of the magnet spectrometer. It should measure the total energy spread in the range from 0.1% up to a few percents for any single or any
group of electron bunches in the bunch train of TTF Linac. SEMG Profile measurements with new high sensitive
electronics are described. Beam results of SEMG Monitor test are given for two modifications of an electronic
preamplifier. |
|---|