Peculiarities of the bunch shape monitor operation for high-intensity electron beams
The simulation results of the Bunch Shape Monitor operation using coherent transformation of a time structure of an analyzed high-intensity electron beam into a spatial one of low-energy electrons emitted from a wire target will be presented. The electromagnetic field of an analyzed bunch disturbs t...
Збережено в:
| Дата: | 2001 |
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| Автори: | , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Національний науковий центр «Харківський фізико-технічний інститут» НАН України
2001
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| Назва видання: | Вопросы атомной науки и техники |
| Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/79255 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Peculiarities of the bunch shape monitor operation for high-intensity electron beams / V.A. Moiseev, A.V. Feschenko // Вопросы атомной науки и техники. — 2001. — № 3. — С. 131-133. — Бібліогр.: 7 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
irk-123456789-79255 |
|---|---|
| record_format |
dspace |
| spelling |
irk-123456789-792552015-03-31T03:02:04Z Peculiarities of the bunch shape monitor operation for high-intensity electron beams Moiseev, V.A. Feschenko, A.V. The simulation results of the Bunch Shape Monitor operation using coherent transformation of a time structure of an analyzed high-intensity electron beam into a spatial one of low-energy electrons emitted from a wire target will be presented. The electromagnetic field of an analyzed bunch disturbs the trajectories of secondary electrons, thus resulting in a degradation of phase resolution and in errors of phase position reading. Moreover there is a perturbation of the target potential due to the current compensating emission of the secondary electrons. The accuracy analysis has been carried out. The confident result to achieve the phase resolution less then one degree was obtained. 2001 Article Peculiarities of the bunch shape monitor operation for high-intensity electron beams / V.A. Moiseev, A.V. Feschenko // Вопросы атомной науки и техники. — 2001. — № 3. — С. 131-133. — Бібліогр.: 7 назв. — англ. 1562-6016 PACS numbers: 29.27.Bd http://dspace.nbuv.gov.ua/handle/123456789/79255 en Вопросы атомной науки и техники Національний науковий центр «Харківський фізико-технічний інститут» НАН України |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| language |
English |
| description |
The simulation results of the Bunch Shape Monitor operation using coherent transformation of a time structure of an analyzed high-intensity electron beam into a spatial one of low-energy electrons emitted from a wire target will be presented. The electromagnetic field of an analyzed bunch disturbs the trajectories of secondary electrons, thus resulting in a degradation of phase resolution and in errors of phase position reading. Moreover there is a perturbation of the target potential due to the current compensating emission of the secondary electrons. The accuracy analysis has been carried out. The confident result to achieve the phase resolution less then one degree was obtained. |
| format |
Article |
| author |
Moiseev, V.A. Feschenko, A.V. |
| spellingShingle |
Moiseev, V.A. Feschenko, A.V. Peculiarities of the bunch shape monitor operation for high-intensity electron beams Вопросы атомной науки и техники |
| author_facet |
Moiseev, V.A. Feschenko, A.V. |
| author_sort |
Moiseev, V.A. |
| title |
Peculiarities of the bunch shape monitor operation for high-intensity electron beams |
| title_short |
Peculiarities of the bunch shape monitor operation for high-intensity electron beams |
| title_full |
Peculiarities of the bunch shape monitor operation for high-intensity electron beams |
| title_fullStr |
Peculiarities of the bunch shape monitor operation for high-intensity electron beams |
| title_full_unstemmed |
Peculiarities of the bunch shape monitor operation for high-intensity electron beams |
| title_sort |
peculiarities of the bunch shape monitor operation for high-intensity electron beams |
| publisher |
Національний науковий центр «Харківський фізико-технічний інститут» НАН України |
| publishDate |
2001 |
| url |
http://dspace.nbuv.gov.ua/handle/123456789/79255 |
| citation_txt |
Peculiarities of the bunch shape monitor operation for high-intensity electron beams / V.A. Moiseev, A.V. Feschenko // Вопросы атомной науки и техники. — 2001. — № 3. — С. 131-133. — Бібліогр.: 7 назв. — англ. |
| series |
Вопросы атомной науки и техники |
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AT moiseevva peculiaritiesofthebunchshapemonitoroperationforhighintensityelectronbeams AT feschenkoav peculiaritiesofthebunchshapemonitoroperationforhighintensityelectronbeams |
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2023-10-18T19:18:16Z |
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2023-10-18T19:18:16Z |
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1796146552766464000 |