Structural state study of high-purity titanium after severe plastic deformation and cryogenic quasi-hydrostatic extrusion by XRD methods

Nanocrystalline bulk high-purity titanium samples were obtained by combined severe plastic deformation SPD, thermal treatment and quasi-hydrostatic extrusion QHE at liquid nitrogen LNT and room RT temperatures. Texture and microstructural evolution of Ti have been investigated by XRD methods. The ef...

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Збережено в:
Бібліографічні деталі
Дата:2015
Автори: Boklag, E.E., Kolodiy, І.V., Tikhonovsky, M.A., Kislyak, I.F., Khaimovich, P.A., Efimov, A.A.
Формат: Стаття
Мова:English
Опубліковано: Національний науковий центр «Харківський фізико-технічний інститут» НАН України 2015
Назва видання:Вопросы атомной науки и техники
Теми:
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/82448
Теги: Додати тег
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Structural state study of high-purity titanium after severe plastic deformation and cryogenic quasi-hydrostatic extrusion by XRD methods / E.E. Boklag, І.V. Kolodiy, M.A. Tikhonovsky, I.F. Kislyak, P.А. Khaimovich, A.A. Efimov // Вопросы атомной науки и техники. — 2015. — № 2. — С. 95-99. — Бібліогр.: 23 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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Резюме:Nanocrystalline bulk high-purity titanium samples were obtained by combined severe plastic deformation SPD, thermal treatment and quasi-hydrostatic extrusion QHE at liquid nitrogen LNT and room RT temperatures. Texture and microstructural evolution of Ti have been investigated by XRD methods. The effect of initial structural state on deformation behavior of Ti after QHE was established. QHE of ultrafine-grained samples leads to structure formation, which parameters are independent on temperature of QHE. Significant differences in QHE process are observed for pre-annealed coarse-grained samples. These differences are related to deformation mechanisms, activated during the QHE process at LNT and RT.