Peculiarities of the radiometric measurements on Uragan-3M torsatron for RF heated plasma
Frequency spectrum (radial profile) of X-mode second harmonic electron cyclotron emission was observed for optically thin plasma produced by Alfvén resonance heating in Uragan-3M torsatron. Radial electron temperature profile within frequency range 31.5–37.5GHz is covered a significant portion of...
Збережено в:
Дата: | 2011 |
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Автори: | , , , |
Формат: | Стаття |
Мова: | English |
Опубліковано: |
Національний науковий центр «Харківський фізико-технічний інститут» НАН України
2011
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Назва видання: | Вопросы атомной науки и техники |
Теми: | |
Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/91074 |
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Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
Цитувати: | Peculiarities of the radiometric measurements on Uragan-3M torsatron for RF heated plasma / R.O. Pavlichenko, A.E. Kulaga, N.V. Zamanov, O.S. Pavlichenko // Вопросы атомной науки и техники. — 2011. — № 1. — С. 191-193. — Бібліогр.: 3 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of UkraineРезюме: | Frequency spectrum (radial profile) of X-mode second harmonic electron cyclotron emission was observed for
optically thin plasma produced by Alfvén resonance heating in Uragan-3M torsatron. Radial electron temperature
profile within frequency range 31.5–37.5GHz is covered a significant portion of the plasma column radius. Temperature
profile derived from “radiation temperature” profile. This procedure neglects multiple reflections of ECE radiation from
the torsatron inner structure (mainly from helical coils). We relate the mismatch effect of the ECE radiation data by the
strong modification of emission level by plasma opacity (small plasma optical depth) and by the scrambling effect. This
effect results from both O-X mode conversion. Electron temperature is calculated from radiation temperature using
tokamak approximation for the optical thickness. The difference in ECE and other data is explained using some
modification of electron density profile. |
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