Розроблення алгоритмів розпізнавання дефектів у структурі кодової послідовності на поверхні модуляційних дисків
This study investigates algorithms for detecting and localizing defects in code sequence structures on modulation disk surfaces. It targets small anomalies in lithographically patterned elements that can cause readout errors or reduced measurement accuracy. A multi-level image-processing model combi...
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| Date: | 2025 |
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| Main Authors: | , , , , |
| Format: | Article |
| Language: | English |
| Published: |
The National Technical University of Ukraine "Igor Sikorsky Kyiv Polytechnic Institute"
2025
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| Subjects: | |
| Online Access: | http://journal.iasa.kpi.ua/article/view/351403 |
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| Journal Title: | System research and information technologies |
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