Paramagnetic centers in amorphous and microcrystalline silicon irradiated with 2 МeV electrons
Amorphous and microcrystalline silicon are well known materials for thin film large area electronics. The defects in the material are an important issue for the device quality and the manufacturing process optimization. We study defects in thin film silicon with electron spin resonance (ESR). In ord...
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| Published in: | Вопросы атомной науки и техники |
|---|---|
| Date: | 2007 |
| Main Authors: | Astakhov, O., Finger, F., Carius, R., Lambertz, A., Neklyudov, I., Petrusenko, Yu., Borysenko, V., Barankov, D. |
| Format: | Article |
| Language: | English |
| Published: |
Національний науковий центр «Харківський фізико-технічний інститут» НАН України
2007
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| Subjects: | |
| Online Access: | https://nasplib.isofts.kiev.ua/handle/123456789/110646 |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | Paramagnetic centers in amorphous and microcrystalline silicon irradiated with 2 МeV electrons/ O. Astakhov, F. Finger, R. Carius, A. Lambertz, I. Neklyudov, Yu. Petrusenko, V.Borysenko, D. Barankov // Вопросы атомной науки и техники. — 2007. — № 2. — С. 39-42. — Бібліогр.: 16 назв. — англ. |
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