Soft X-ray measurement by SPPD11-04 detectors on the PF “Tulip” installation

• Published in: Вопросы атомной науки и техники
• Date: 2008
• Main Authors: Eliseev, S.P., Nikulin, V.Ya., Silin, P.V.
• Format: Article
• Language: English
• Published: Національний науковий центр «Харківський фізико-технічний інститут» НАН України 2008
• Subjects: Plasma diagnostics
• Online Access: https://nasplib.isofts.kiev.ua/handle/123456789/111026
• Journal Title: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Cite this: Soft X-ray measurement by SPPD11-04 detectors on the PF “Tulip” installation / S.P. Eliseev, V.Ya. Nikulin, P.V. Silin // Вопросы атомной науки и техники. — 2008. — № 6. — С. 222-224. — Бібліогр.: 2 назв. — англ.

The soft X-ray (SXR) measurements were received with help of the fast semiconductor detectors SPPD11-04 with exposure time about 1.5 ns. Observation directions were at 45° and 90° to the chamber axis. The SXR dependence from pressure was designed. The radiation maximum corresponded to argon pressure...