Bochek, G., Deiev, O., Maslov, N., & Voloshyn, V. (2011). X-ray lines relative intensity depending on detector efficiency, foils and cases thickness for primary and scattered spectra. Вопросы атомной науки и техники.
Chicago-Zitierstil (17. Ausg.)Bochek, G.L, O.S Deiev, N.I Maslov, und V.K Voloshyn. "X-ray Lines Relative Intensity Depending on Detector Efficiency, Foils and Cases Thickness for Primary and Scattered Spectra." Вопросы атомной науки и техники 2011.
MLA-Zitierstil (8. Ausg.)Bochek, G.L, et al. "X-ray Lines Relative Intensity Depending on Detector Efficiency, Foils and Cases Thickness for Primary and Scattered Spectra." Вопросы атомной науки и техники, 2011.
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