X-ray lines relative intensity depending on detector efficiency, foils and cases thickness for primary and scattered spectra

• Published in: Вопросы атомной науки и техники
• Date: 2011
• Main Authors: Bochek, G.L., Deiev, O.S., Maslov, N.I., Voloshyn, V.K.
• Format: Article
• Language: English
• Published: Національний науковий центр «Харківський фізико-технічний інститут» НАН України 2011
• Subjects: Ядернo-физические методы и обработка данных
• Online Access: https://nasplib.isofts.kiev.ua/handle/123456789/111134
• Journal Title: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Cite this: X-ray lines relative intensity depending on detector efficiency, foils and cases thickness for primary and scattered spectra / G.L.Bochek, O.S.Deiev, N.I.Maslov, V.K.Voloshyn // Вопросы атомной науки и техники. — 2011. — № 3. — С. 42-49. — Бібліогр.: 12 назв. — англ.

Primary and Compton scattered radiation spectra from radioactive source ²⁴¹Am were measured in various geometry and for various targets. Spectral lines intensity of characteristic X-ray radiation (CXR), Compton and Rayleigh scattering are defined. The back scattering peak for a line 59.54 keV was ex...