Permissible technological limitations of quadrupole lenses used in parameter multiplets for ion microprobe forming
Parasitic components of lens field are ones of the main parameters that determine spatial resolution of the MeV energy ion microprobe based on parameter multiplet of the magnetic quadrupole lenses. The parameter set of probe-forming systems was examined, the maximum permissible parasitic components...
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| Veröffentlicht in: | Вопросы атомной науки и техники |
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| Datum: | 2003 |
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| Format: | Artikel |
| Sprache: | English |
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Національний науковий центр «Харківський фізико-технічний інститут» НАН України
2003
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Permissible technological limitations of quadrupole lenses used in parameter multiplets for ion microprobe forming / K.I. Melnik, A.G. Ponomarev // Вопросы атомной науки и техники. — 2003. — № 4. — С. 301-304. — Бібліогр.: 6 назв. — англ. |
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Melnik, K.I. Ponomarev, A.G. 2017-01-08T19:29:39Z 2017-01-08T19:29:39Z 2003 Permissible technological limitations of quadrupole lenses used in parameter multiplets for ion microprobe forming / K.I. Melnik, A.G. Ponomarev // Вопросы атомной науки и техники. — 2003. — № 4. — С. 301-304. — Бібліогр.: 6 назв. — англ. 1562-6016 https://nasplib.isofts.kiev.ua/handle/123456789/111225 539.1.078 Parasitic components of lens field are ones of the main parameters that determine spatial resolution of the MeV energy ion microprobe based on parameter multiplet of the magnetic quadrupole lenses. The parameter set of probe-forming systems was examined, the maximum permissible parasitic components of the lens field were computed, technological limitations on pole tips positioning accuracy were determined such that aberrations caused by them did not result in substantial beam degradation. Influence of the field parasitic components on ion-optical properties of multiplets was estimated, and computation technique was presented. en Національний науковий центр «Харківський фізико-технічний інститут» НАН України Вопросы атомной науки и техники Приложения и технологии Permissible technological limitations of quadrupole lenses used in parameter multiplets for ion microprobe forming Article published earlier |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| title |
Permissible technological limitations of quadrupole lenses used in parameter multiplets for ion microprobe forming |
| spellingShingle |
Permissible technological limitations of quadrupole lenses used in parameter multiplets for ion microprobe forming Melnik, K.I. Ponomarev, A.G. Приложения и технологии |
| title_short |
Permissible technological limitations of quadrupole lenses used in parameter multiplets for ion microprobe forming |
| title_full |
Permissible technological limitations of quadrupole lenses used in parameter multiplets for ion microprobe forming |
| title_fullStr |
Permissible technological limitations of quadrupole lenses used in parameter multiplets for ion microprobe forming |
| title_full_unstemmed |
Permissible technological limitations of quadrupole lenses used in parameter multiplets for ion microprobe forming |
| title_sort |
permissible technological limitations of quadrupole lenses used in parameter multiplets for ion microprobe forming |
| author |
Melnik, K.I. Ponomarev, A.G. |
| author_facet |
Melnik, K.I. Ponomarev, A.G. |
| topic |
Приложения и технологии |
| topic_facet |
Приложения и технологии |
| publishDate |
2003 |
| language |
English |
| container_title |
Вопросы атомной науки и техники |
| publisher |
Національний науковий центр «Харківський фізико-технічний інститут» НАН України |
| format |
Article |
| description |
Parasitic components of lens field are ones of the main parameters that determine spatial resolution of the MeV energy ion microprobe based on parameter multiplet of the magnetic quadrupole lenses. The parameter set of probe-forming systems was examined, the maximum permissible parasitic components of the lens field were computed, technological limitations on pole tips positioning accuracy were determined such that aberrations caused by them did not result in substantial beam degradation. Influence of the field parasitic components on ion-optical properties of multiplets was estimated, and computation technique was presented.
|
| issn |
1562-6016 |
| url |
https://nasplib.isofts.kiev.ua/handle/123456789/111225 |
| citation_txt |
Permissible technological limitations of quadrupole lenses used in parameter multiplets for ion microprobe forming / K.I. Melnik, A.G. Ponomarev // Вопросы атомной науки и техники. — 2003. — № 4. — С. 301-304. — Бібліогр.: 6 назв. — англ. |
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AT melnikki permissibletechnologicallimitationsofquadrupolelensesusedinparametermultipletsforionmicroprobeforming AT ponomarevag permissibletechnologicallimitationsofquadrupolelensesusedinparametermultipletsforionmicroprobeforming |
| first_indexed |
2025-12-02T05:31:22Z |
| last_indexed |
2025-12-02T05:31:22Z |
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