Permissible technological limitations of quadrupole lenses used in parameter multiplets for ion microprobe forming
Parasitic components of lens field are ones of the main parameters that determine spatial resolution of the MeV energy ion microprobe based on parameter multiplet of the magnetic quadrupole lenses. The parameter set of probe-forming systems was examined, the maximum permissible parasitic components...
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| Published in: | Вопросы атомной науки и техники |
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| Date: | 2003 |
| Main Authors: | , |
| Format: | Article |
| Language: | English |
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Національний науковий центр «Харківський фізико-технічний інститут» НАН України
2003
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| Online Access: | https://nasplib.isofts.kiev.ua/handle/123456789/111225 |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | Permissible technological limitations of quadrupole lenses used in parameter multiplets for ion microprobe forming / K.I. Melnik, A.G. Ponomarev // Вопросы атомной науки и техники. — 2003. — № 4. — С. 301-304. — Бібліогр.: 6 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862656894148018176 |
|---|---|
| author | Melnik, K.I. Ponomarev, A.G. |
| author_facet | Melnik, K.I. Ponomarev, A.G. |
| citation_txt | Permissible technological limitations of quadrupole lenses used in parameter multiplets for ion microprobe forming / K.I. Melnik, A.G. Ponomarev // Вопросы атомной науки и техники. — 2003. — № 4. — С. 301-304. — Бібліогр.: 6 назв. — англ. |
| collection | DSpace DC |
| container_title | Вопросы атомной науки и техники |
| description | Parasitic components of lens field are ones of the main parameters that determine spatial resolution of the MeV energy ion microprobe based on parameter multiplet of the magnetic quadrupole lenses. The parameter set of probe-forming systems was examined, the maximum permissible parasitic components of the lens field were computed, technological limitations on pole tips positioning accuracy were determined such that aberrations caused by them did not result in substantial beam degradation. Influence of the field parasitic components on ion-optical properties of multiplets was estimated, and computation technique was presented.
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| first_indexed | 2025-12-02T05:31:22Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-111225 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1562-6016 |
| language | English |
| last_indexed | 2025-12-02T05:31:22Z |
| publishDate | 2003 |
| publisher | Національний науковий центр «Харківський фізико-технічний інститут» НАН України |
| record_format | dspace |
| spelling | Melnik, K.I. Ponomarev, A.G. 2017-01-08T19:29:39Z 2017-01-08T19:29:39Z 2003 Permissible technological limitations of quadrupole lenses used in parameter multiplets for ion microprobe forming / K.I. Melnik, A.G. Ponomarev // Вопросы атомной науки и техники. — 2003. — № 4. — С. 301-304. — Бібліогр.: 6 назв. — англ. 1562-6016 https://nasplib.isofts.kiev.ua/handle/123456789/111225 539.1.078 Parasitic components of lens field are ones of the main parameters that determine spatial resolution of the MeV energy ion microprobe based on parameter multiplet of the magnetic quadrupole lenses. The parameter set of probe-forming systems was examined, the maximum permissible parasitic components of the lens field were computed, technological limitations on pole tips positioning accuracy were determined such that aberrations caused by them did not result in substantial beam degradation. Influence of the field parasitic components on ion-optical properties of multiplets was estimated, and computation technique was presented. en Національний науковий центр «Харківський фізико-технічний інститут» НАН України Вопросы атомной науки и техники Приложения и технологии Permissible technological limitations of quadrupole lenses used in parameter multiplets for ion microprobe forming Article published earlier |
| spellingShingle | Permissible technological limitations of quadrupole lenses used in parameter multiplets for ion microprobe forming Melnik, K.I. Ponomarev, A.G. Приложения и технологии |
| title | Permissible technological limitations of quadrupole lenses used in parameter multiplets for ion microprobe forming |
| title_full | Permissible technological limitations of quadrupole lenses used in parameter multiplets for ion microprobe forming |
| title_fullStr | Permissible technological limitations of quadrupole lenses used in parameter multiplets for ion microprobe forming |
| title_full_unstemmed | Permissible technological limitations of quadrupole lenses used in parameter multiplets for ion microprobe forming |
| title_short | Permissible technological limitations of quadrupole lenses used in parameter multiplets for ion microprobe forming |
| title_sort | permissible technological limitations of quadrupole lenses used in parameter multiplets for ion microprobe forming |
| topic | Приложения и технологии |
| topic_facet | Приложения и технологии |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/111225 |
| work_keys_str_mv | AT melnikki permissibletechnologicallimitationsofquadrupolelensesusedinparametermultipletsforionmicroprobeforming AT ponomarevag permissibletechnologicallimitationsofquadrupolelensesusedinparametermultipletsforionmicroprobeforming |