Temperature dependence of the energy resolution and leakage current of the planar silicone detectors

• Date: 2013
• Main Authors: Deiev, O.S., Maslov, N.I., Ovchinnik, V.D., Potin, S.M., Shulika, M.Y., Vasilyev, G.P., Voloshyn, V.K., Yalovenko, V.I.
• Format: Article
• Language: English
• Published: Національний науковий центр «Харківський фізико-технічний інститут» НАН України 2013
• Series: Вопросы атомной науки и техники
• Subjects: Ядернo-физические методы и обработка данных
• Online Access: https://nasplib.isofts.kiev.ua/handle/123456789/111839
• Journal Title: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Cite this: Temperature dependence of the energy resolution and leakage current of the planar silicone detectors / O.S. Deiev, N.I. Maslov, V.D. Ovchinnik, S.M. Potin, M.Y. Shulika, G.P. Vasilyev, V.K. Voloshyn, V.I. Yalovenko // Вопросы атомной науки и техники. — 2013. — № 3. — С. 253-258. — Бібліогр.: 7 назв. — англ.

The method of measurement and automated test probe station for the study of the temperature dependence of the leakage current and energy resolution of single-channel planar silicon detectors (PSD) was created. Energy resolution and leakage current of PSD with different initial (at room temperature)...