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Scanning Tunneling Microscopy/Spectroscopy and Low-Energy Electron Diffraction Investigations of GaTe Layered Crystal Cleavage Surface

Scanning tunnelling microscopy and spectroscopy (STM/STS) and low-energy electron diffraction (LEED) techniques are used in combination to study the surface structure of GaTe cleavages. Two different structures, hexagonal one on macroscale and monoclinic one randomly distributed on nanoscale, are id...

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Bibliographic Details
Published in:Металлофизика и новейшие технологии
Date:2015
Main Authors: Galiy, P., Nenchuk, T., Ciszewski, A., Mazur, P., Zuber, S., Yarovets, I.
Format: Article
Language:English
Published: Інститут металофізики ім. Г.В. Курдюмова НАН України 2015
Subjects:
Дефекты кристаллической решётки
Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/112254
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Scanning Tunneling Microscopy/Spectroscopy and Low-Energy Electron Diffraction Investigations of GaTe Layered Crystal Cleavage Surface / P. Galiy, T. Nenchuk, A. Ciszewski, P. Mazur, S. Zuber, I. Yarovets // Металлофизика и новейшие технологии. — 2015. — Т. 37, № 6. — С. 789-801. — Бібліогр.: 9 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine

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