Capacitance spectroscopy of InAs self-assembled quantum dots

• Published in: Semiconductor Physics Quantum Electronics & Optoelectronics
• Date: 1998
• Main Authors: Martin, P.M., Belyaev, A.E., Eaves, L., Main, P.C., Sheard, F.W., Ihn, T., Henini, M.
• Format: Article
• Language: English
• Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 1998
• Online Access: https://nasplib.isofts.kiev.ua/handle/123456789/114663
• Journal Title: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Cite this: Capacitance spectroscopy of InAs self-assembled quantum dots / P.M. Martin, A.E. Belyaev, L. Eaves, P.C. Main, F.W. Sheard, T. Ihn, M. Henini // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1998. — Т. 1, № 1. — С. 7-12. — Бібліогр.: 16 назв. — англ.

Capacitance spectroscopy is used to study electronic properties of self-assembled InAs quantum dots. The capacitance-voltage, C(V), measurements in combination with the magneto-capacitance, C(B), results make it possible to investigate the electrostatic profile of a series of single-barrier n-i-n Ga...