Conductance of a tunnel point contact of noble metals in the presence of a single defect
In paper (Avotina et.al., Phys. Rev. B74, 085411 (2006)) the effect of Fermi surface anisotropy to the conductance of a tunnel point contact, in the vicinity of which a single point-like defect is situated, has been investigated theoretically. The oscillatory dependence of the conductance on the d...
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| Опубліковано в: : | Физика низких температур |
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| Дата: | 2008 |
| Автори: | , , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
2008
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| Теми: | |
| Онлайн доступ: | https://nasplib.isofts.kiev.ua/handle/123456789/116863 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Conductance of a tunnel point contact of noble metals in the presence of a single defect / Ye.S. Avotina, Yu.A. Kolesnichenko, S.B. Roobol, J.M. van Ruitenbeek // Физика низких температур. — 2008. — Т. 34, № 3. — С. 268–272. — Бібліогр.: 18 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| Резюме: | In paper (Avotina et.al., Phys. Rev. B74, 085411 (2006)) the effect of Fermi surface anisotropy to the
conductance of a tunnel point contact, in the vicinity of which a single point-like defect is situated, has been
investigated theoretically. The oscillatory dependence of the conductance on the distance between the contact
and the defect has been found for a general Fermi surface geometry. In this paper we apply the method
developed in (Avotina et.al., Phys. Rev. B74, 085411 (2006)) to the calculation of the conductance of noble
metal contacts. An original algorithm, which enables the computation of the conductance for any
parametrically given Fermi surface, is proposed. On this basis a pattern of the conductance oscillations,
which can be observed by the method of scanning tunneling microscopy, is obtained for different orientations
of the surface for the noble metals.
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| ISSN: | 0132-6414 |