Photoelectron emission from solid Ne tested by impurity adsorption

Electron emission was obtained from a solid Ne sample growing from the gas phase on a low temperature substrate. The surface of the sample was irradiated by the light of an open-source microwave discharge running in the gaseous Ne. A second gas flow of CH₄ was, simultaneously, passed onto the substr...

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Veröffentlicht in:Физика низких температур
Datum:2009
1. Verfasser: Dmitriev, Yu.A.
Format: Artikel
Sprache:Englisch
Veröffentlicht: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2009
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Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/117106
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Photoelectron emission from solid Ne tested by impurity adsorption / Yu.A. Dmitriev // Физика низких температур. — 2009. — Т. 35, № 4. — С. 350-354. — Бібліогр.: 12 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
Beschreibung
Zusammenfassung:Electron emission was obtained from a solid Ne sample growing from the gas phase on a low temperature substrate. The surface of the sample was irradiated by the light of an open-source microwave discharge running in the gaseous Ne. A second gas flow of CH₄ was, simultaneously, passed onto the substrate avoiding the discharge zone. Free electrons ejected into a vacuum chamber during the sample growth were detected by means of the electron cyclotron resonance (ECR) technique. The electron yield was found to be decrease at increasing CH₄ flow. Fitting curves to the experimental data showed that the surface CH₄ impurities played the major role in emission quenching. Atemperature effect was observed in which a 4.2 K sample was much more sensitive to CH₄ doping than a 1.6 K one. Based on the experimental results, a model was proposed of the surface sites where electrons escape the solid.
ISSN:0132-6414