Electron traps in solid Xe

Correlated real-time measurements of thermally stimulated luminescence and exoelectron emission from solid Xe pre-irradiated with an electron beam were performed. The study enabled us to distinguish between surface and bulk traps in solid Xe and to identify a peak related to electronically induced d...

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Збережено в:
Бібліографічні деталі
Опубліковано в: :Физика низких температур
Дата:2009
Автори: Khyzhniy, Ivan V., Uyutnov, Sergey A., Savchenko, Elena V., Gumenchuk, Galina B., Ponomaryov, Alexey N., Bondybey, Vladimir E.
Формат: Стаття
Мова:English
Опубліковано: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2009
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Онлайн доступ:https://nasplib.isofts.kiev.ua/handle/123456789/117131
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Electron traps in solid Xe / Ivan V. Khyzhniy, Sergey A. Uyutnov, Elena V. Savchenko, Galina B. Gumenchuk, Alexey N. Ponomaryov, Vladimir E. Bondybey // Физика низких температур. — 2009. — Т. 35, № 4. — С. 433-437. — Бібліогр.: 13 назв. — англ.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-117131
record_format dspace
spelling Khyzhniy, Ivan V.
Uyutnov, Sergey A.
Savchenko, Elena V.
Gumenchuk, Galina B.
Ponomaryov, Alexey N.
Bondybey, Vladimir E.
2017-05-20T07:09:33Z
2017-05-20T07:09:33Z
2009
Electron traps in solid Xe / Ivan V. Khyzhniy, Sergey A. Uyutnov, Elena V. Savchenko, Galina B. Gumenchuk, Alexey N. Ponomaryov, Vladimir E. Bondybey // Физика низких температур. — 2009. — Т. 35, № 4. — С. 433-437. — Бібліогр.: 13 назв. — англ.
0132-6414
PACS: 78.60.Kn, 79.75.+g
https://nasplib.isofts.kiev.ua/handle/123456789/117131
Correlated real-time measurements of thermally stimulated luminescence and exoelectron emission from solid Xe pre-irradiated with an electron beam were performed. The study enabled us to distinguish between surface and bulk traps in solid Xe and to identify a peak related to electronically induced defects. The activation energy corresponding to annihilation of these defects was estimated by the following methods: the method of different heating rates, the initial-rise method, and the curve cleaning technique with fitting of the thermally stimulated luminescence glow curve.
en
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
Физика низких температур
7th International Conference on Cryocrystals and Quantum Crystals
Electron traps in solid Xe
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Electron traps in solid Xe
spellingShingle Electron traps in solid Xe
Khyzhniy, Ivan V.
Uyutnov, Sergey A.
Savchenko, Elena V.
Gumenchuk, Galina B.
Ponomaryov, Alexey N.
Bondybey, Vladimir E.
7th International Conference on Cryocrystals and Quantum Crystals
title_short Electron traps in solid Xe
title_full Electron traps in solid Xe
title_fullStr Electron traps in solid Xe
title_full_unstemmed Electron traps in solid Xe
title_sort electron traps in solid xe
author Khyzhniy, Ivan V.
Uyutnov, Sergey A.
Savchenko, Elena V.
Gumenchuk, Galina B.
Ponomaryov, Alexey N.
Bondybey, Vladimir E.
author_facet Khyzhniy, Ivan V.
Uyutnov, Sergey A.
Savchenko, Elena V.
Gumenchuk, Galina B.
Ponomaryov, Alexey N.
Bondybey, Vladimir E.
topic 7th International Conference on Cryocrystals and Quantum Crystals
topic_facet 7th International Conference on Cryocrystals and Quantum Crystals
publishDate 2009
language English
container_title Физика низких температур
publisher Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
format Article
description Correlated real-time measurements of thermally stimulated luminescence and exoelectron emission from solid Xe pre-irradiated with an electron beam were performed. The study enabled us to distinguish between surface and bulk traps in solid Xe and to identify a peak related to electronically induced defects. The activation energy corresponding to annihilation of these defects was estimated by the following methods: the method of different heating rates, the initial-rise method, and the curve cleaning technique with fitting of the thermally stimulated luminescence glow curve.
issn 0132-6414
url https://nasplib.isofts.kiev.ua/handle/123456789/117131
citation_txt Electron traps in solid Xe / Ivan V. Khyzhniy, Sergey A. Uyutnov, Elena V. Savchenko, Galina B. Gumenchuk, Alexey N. Ponomaryov, Vladimir E. Bondybey // Физика низких температур. — 2009. — Т. 35, № 4. — С. 433-437. — Бібліогр.: 13 назв. — англ.
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first_indexed 2025-12-02T14:14:52Z
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