Electron traps in solid Xe
Correlated real-time measurements of thermally stimulated luminescence and exoelectron emission from solid Xe pre-irradiated with an electron beam were performed. The study enabled us to distinguish between surface and bulk traps in solid Xe and to identify a peak related to electronically induced d...
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| Опубліковано в: : | Физика низких температур |
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| Дата: | 2009 |
| Автори: | , , , , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
2009
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| Онлайн доступ: | https://nasplib.isofts.kiev.ua/handle/123456789/117131 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Electron traps in solid Xe / Ivan V. Khyzhniy, Sergey A. Uyutnov, Elena V. Savchenko, Galina B. Gumenchuk, Alexey N. Ponomaryov, Vladimir E. Bondybey // Физика низких температур. — 2009. — Т. 35, № 4. — С. 433-437. — Бібліогр.: 13 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
nasplib_isofts_kiev_ua-123456789-117131 |
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dspace |
| spelling |
Khyzhniy, Ivan V. Uyutnov, Sergey A. Savchenko, Elena V. Gumenchuk, Galina B. Ponomaryov, Alexey N. Bondybey, Vladimir E. 2017-05-20T07:09:33Z 2017-05-20T07:09:33Z 2009 Electron traps in solid Xe / Ivan V. Khyzhniy, Sergey A. Uyutnov, Elena V. Savchenko, Galina B. Gumenchuk, Alexey N. Ponomaryov, Vladimir E. Bondybey // Физика низких температур. — 2009. — Т. 35, № 4. — С. 433-437. — Бібліогр.: 13 назв. — англ. 0132-6414 PACS: 78.60.Kn, 79.75.+g https://nasplib.isofts.kiev.ua/handle/123456789/117131 Correlated real-time measurements of thermally stimulated luminescence and exoelectron emission from solid Xe pre-irradiated with an electron beam were performed. The study enabled us to distinguish between surface and bulk traps in solid Xe and to identify a peak related to electronically induced defects. The activation energy corresponding to annihilation of these defects was estimated by the following methods: the method of different heating rates, the initial-rise method, and the curve cleaning technique with fitting of the thermally stimulated luminescence glow curve. en Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України Физика низких температур 7th International Conference on Cryocrystals and Quantum Crystals Electron traps in solid Xe Article published earlier |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| title |
Electron traps in solid Xe |
| spellingShingle |
Electron traps in solid Xe Khyzhniy, Ivan V. Uyutnov, Sergey A. Savchenko, Elena V. Gumenchuk, Galina B. Ponomaryov, Alexey N. Bondybey, Vladimir E. 7th International Conference on Cryocrystals and Quantum Crystals |
| title_short |
Electron traps in solid Xe |
| title_full |
Electron traps in solid Xe |
| title_fullStr |
Electron traps in solid Xe |
| title_full_unstemmed |
Electron traps in solid Xe |
| title_sort |
electron traps in solid xe |
| author |
Khyzhniy, Ivan V. Uyutnov, Sergey A. Savchenko, Elena V. Gumenchuk, Galina B. Ponomaryov, Alexey N. Bondybey, Vladimir E. |
| author_facet |
Khyzhniy, Ivan V. Uyutnov, Sergey A. Savchenko, Elena V. Gumenchuk, Galina B. Ponomaryov, Alexey N. Bondybey, Vladimir E. |
| topic |
7th International Conference on Cryocrystals and Quantum Crystals |
| topic_facet |
7th International Conference on Cryocrystals and Quantum Crystals |
| publishDate |
2009 |
| language |
English |
| container_title |
Физика низких температур |
| publisher |
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України |
| format |
Article |
| description |
Correlated real-time measurements of thermally stimulated luminescence and exoelectron emission from solid Xe pre-irradiated with an electron beam were performed. The study enabled us to distinguish between surface and bulk traps in solid Xe and to identify a peak related to electronically induced defects. The activation energy corresponding to annihilation of these defects was estimated by the following methods: the method of different heating rates, the initial-rise method, and the curve cleaning technique with fitting of the thermally stimulated luminescence glow curve.
|
| issn |
0132-6414 |
| url |
https://nasplib.isofts.kiev.ua/handle/123456789/117131 |
| citation_txt |
Electron traps in solid Xe / Ivan V. Khyzhniy, Sergey A. Uyutnov, Elena V. Savchenko, Galina B. Gumenchuk, Alexey N. Ponomaryov, Vladimir E. Bondybey // Физика низких температур. — 2009. — Т. 35, № 4. — С. 433-437. — Бібліогр.: 13 назв. — англ. |
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2025-12-02T14:14:52Z |
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