Electron traps in solid Xe
Correlated real-time measurements of thermally stimulated luminescence and exoelectron emission from solid Xe pre-irradiated with an electron beam were performed. The study enabled us to distinguish between surface and bulk traps in solid Xe and to identify a peak related to electronically induced d...
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| Veröffentlicht in: | Физика низких температур |
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| Datum: | 2009 |
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| Format: | Artikel |
| Sprache: | Englisch |
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Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
2009
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/117131 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Electron traps in solid Xe / Ivan V. Khyzhniy, Sergey A. Uyutnov, Elena V. Savchenko, Galina B. Gumenchuk, Alexey N. Ponomaryov, Vladimir E. Bondybey // Физика низких температур. — 2009. — Т. 35, № 4. — С. 433-437. — Бібліогр.: 13 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862662678358523904 |
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| author | Khyzhniy, Ivan V. Uyutnov, Sergey A. Savchenko, Elena V. Gumenchuk, Galina B. Ponomaryov, Alexey N. Bondybey, Vladimir E. |
| author_facet | Khyzhniy, Ivan V. Uyutnov, Sergey A. Savchenko, Elena V. Gumenchuk, Galina B. Ponomaryov, Alexey N. Bondybey, Vladimir E. |
| citation_txt | Electron traps in solid Xe / Ivan V. Khyzhniy, Sergey A. Uyutnov, Elena V. Savchenko, Galina B. Gumenchuk, Alexey N. Ponomaryov, Vladimir E. Bondybey // Физика низких температур. — 2009. — Т. 35, № 4. — С. 433-437. — Бібліогр.: 13 назв. — англ. |
| collection | DSpace DC |
| container_title | Физика низких температур |
| description | Correlated real-time measurements of thermally stimulated luminescence and exoelectron emission from solid Xe pre-irradiated with an electron beam were performed. The study enabled us to distinguish between surface and bulk traps in solid Xe and to identify a peak related to electronically induced defects. The activation energy corresponding to annihilation of these defects was estimated by the following methods: the method of different heating rates, the initial-rise method, and the curve cleaning technique with fitting of the thermally stimulated luminescence glow curve.
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| first_indexed | 2025-12-02T14:14:52Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-117131 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 0132-6414 |
| language | English |
| last_indexed | 2025-12-02T14:14:52Z |
| publishDate | 2009 |
| publisher | Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України |
| record_format | dspace |
| spelling | Khyzhniy, Ivan V. Uyutnov, Sergey A. Savchenko, Elena V. Gumenchuk, Galina B. Ponomaryov, Alexey N. Bondybey, Vladimir E. 2017-05-20T07:09:33Z 2017-05-20T07:09:33Z 2009 Electron traps in solid Xe / Ivan V. Khyzhniy, Sergey A. Uyutnov, Elena V. Savchenko, Galina B. Gumenchuk, Alexey N. Ponomaryov, Vladimir E. Bondybey // Физика низких температур. — 2009. — Т. 35, № 4. — С. 433-437. — Бібліогр.: 13 назв. — англ. 0132-6414 PACS: 78.60.Kn, 79.75.+g https://nasplib.isofts.kiev.ua/handle/123456789/117131 Correlated real-time measurements of thermally stimulated luminescence and exoelectron emission from solid Xe pre-irradiated with an electron beam were performed. The study enabled us to distinguish between surface and bulk traps in solid Xe and to identify a peak related to electronically induced defects. The activation energy corresponding to annihilation of these defects was estimated by the following methods: the method of different heating rates, the initial-rise method, and the curve cleaning technique with fitting of the thermally stimulated luminescence glow curve. en Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України Физика низких температур 7th International Conference on Cryocrystals and Quantum Crystals Electron traps in solid Xe Article published earlier |
| spellingShingle | Electron traps in solid Xe Khyzhniy, Ivan V. Uyutnov, Sergey A. Savchenko, Elena V. Gumenchuk, Galina B. Ponomaryov, Alexey N. Bondybey, Vladimir E. 7th International Conference on Cryocrystals and Quantum Crystals |
| title | Electron traps in solid Xe |
| title_full | Electron traps in solid Xe |
| title_fullStr | Electron traps in solid Xe |
| title_full_unstemmed | Electron traps in solid Xe |
| title_short | Electron traps in solid Xe |
| title_sort | electron traps in solid xe |
| topic | 7th International Conference on Cryocrystals and Quantum Crystals |
| topic_facet | 7th International Conference on Cryocrystals and Quantum Crystals |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/117131 |
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