Evidence for Griffiths phase in multiferroic BiMnO₃ and BiFe₀.₅Mn₀.₅O₃ films
Microstructure and magnetic properties of the BiMnO₃ and BiFe₀.₅Mn₀.₅O₃ films, prepared by the rf magnetron
 sputtering on LaAlO₃ (001) single-crystalline substrate, have been investigated. The selected-area electron
 diffraction analysis allows us to indentify the crystal structure...
Збережено в:
| Опубліковано в: | Физика низких температур |
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| Дата: | 2012 |
| ISSN: | 0132-6414 |
| Автори: | , , , , , , , , |
| Формат: | Стаття |
| Мова: | Англійська |
| Опубліковано: |
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
2012
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| Теми: | |
| Онлайн доступ: | https://nasplib.isofts.kiev.ua/handle/123456789/117188 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Evidence for Griffiths phase in multiferroic BiMnO₃ and BiFe₀.₅Mn₀.₅O₃ films / V.G. Prokhorov, G.G. Kaminsky, J.M. Kim, Y.J. Yoo, Y.P. Lee , V.L. Svetchnikov, G.G. Levchenko, Yu.M. Nikolaenko, V.A. Khokhlov // Физика низких температур. — 2012. — Т. 38, № 5. — С. 531-537. — Бібліогр.: 30 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| Резюме: | Microstructure and magnetic properties of the BiMnO₃ and BiFe₀.₅Mn₀.₅O₃ films, prepared by the rf magnetron
sputtering on LaAlO₃ (001) single-crystalline substrate, have been investigated. The selected-area electron
diffraction analysis allows us to indentify the crystal structure of the BiMnO₃ film as an orthorhombic one while
the BiFe₀.₅Mn₀.₅O₃ film has a hexagonal lattice symmetry. The high-resolution electron microscopy study reveals
the presence of strip-domain phase with a periodic spacing of about 3c in both films. The magnetic measurements
show that in addition to the basic paramagnetic phase, the films manifest the Griffiths phase behavior
in a wide temperature range. We argue that the observed weak ferromagnetism is provided by an appearance of
the strip-domain layered inclusions rather than the intrinsic physical origin of the films.
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| ISSN: | 0132-6414 |