Role of surface structure in photoelectron emission from solid Ne: impurities, defect and low-coordinated sites

Electron emission was obtained from a solid Ne sample growing from the gas phase on a low temperature
 substrate. The surface of the sample was irradiated by the light of an open-source microwave discharge running
 in the gaseous Ne. The irradiation produces electron emission from th...

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Published in:Физика низких температур
Date:2012
Main Author: Dmitriev, Yu.A.
Format: Article
Language:English
Published: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2012
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Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/117422
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Role of surface structure in photoelectron emission from
 solid Ne: impurities, defect and low-coordinated sites / Yu.A. Dmitriev // Физика низких температур. — 2012. — Т. 38, № 8. — С. 884-893. — Бібліогр.: 43 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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Summary:Electron emission was obtained from a solid Ne sample growing from the gas phase on a low temperature
 substrate. The surface of the sample was irradiated by the light of an open-source microwave discharge running
 in the gaseous Ne. The irradiation produces electron emission from the sample. A second gas flow of D₂ was,
 simultaneously, passed onto the substrate avoiding the discharge zone. Free electrons ejected into a vacuum
 chamber during the sample growth were detected by means of the electron cyclotron resonance technique. The
 emission shows nonmonotonic dependence on the impurity D₂ concentration. At small concentration, the electron
 yield is found to increase significantly at increasing the dopant flow rate, while, at moderate concentrations,
 the yield tends to decrease with increasing the flow rate. A tentative explanation of the observed effect is presented
 based on the exceptional properties which the neon-hydrogen solid mixture is believed to have.
ISSN:0132-6414