Radiation-induced structural changes in chalcogenide glasses as revealed from Raman spectroscopy measurements

Radiation-induced structural changes in the chalcogenide glasses of (As₂S₃)x(GeS₂)₍₁₋х₎ system with x = 0.1, 0.2, 0.4, and 0.6 corresponding to the chemical compositions Ge₂₈.₁₂₅As₆.₂₅S₆₅.₆₂₅, Ge₂₃.₅As₁₁.₈S₆₄.₇, Ge₁₅.₈As₂₁S₆₃.₂, and Ge₉.₅As₂₈.₆S₆₁.₉, respectively, were studied using the Raman spectr...

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Published in:Semiconductor Physics Quantum Electronics & Optoelectronics
Date:2013
Main Author: Kavetskyy, T.S.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2013
Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/117599
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Radiation-induced structural changes in chalcogenide glasses as revealed from Raman spectroscopy measurements / T.S. Kavetskyy // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2013. — Т. 16, № 1. — С. 27-36. — Бібліогр.: 63 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-117599
record_format dspace
spelling Kavetskyy, T.S.
2017-05-25T15:29:24Z
2017-05-25T15:29:24Z
2013
Radiation-induced structural changes in chalcogenide glasses as revealed from Raman spectroscopy measurements / T.S. Kavetskyy // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2013. — Т. 16, № 1. — С. 27-36. — Бібліогр.: 63 назв. — англ.
1560-8034
PACS 61.43.Fs, 61.80.Ed, 78.30.Ly
https://nasplib.isofts.kiev.ua/handle/123456789/117599
Radiation-induced structural changes in the chalcogenide glasses of (As₂S₃)x(GeS₂)₍₁₋х₎ system with x = 0.1, 0.2, 0.4, and 0.6 corresponding to the chemical compositions Ge₂₈.₁₂₅As₆.₂₅S₆₅.₆₂₅, Ge₂₃.₅As₁₁.₈S₆₄.₇, Ge₁₅.₈As₂₁S₆₃.₂, and Ge₉.₅As₂₈.₆S₆₁.₉, respectively, were studied using the Raman spectroscopy technique in detail. The polarized (VV) and depolarized (VH) Raman spectra were recorded separately for two identical samples in the unirradiated and γ-irradiated states which allowed performing all measurements under the same experimental conditions. The Raman spectra were considered in the regions of high-frequency excitations related with the molecular peak, and low-frequency excitations related with the boson peak. The depolarization ratio spectra for the unirradiated and y-irradiated samples were examined, too. The differential Raman spectra in the high-frequency region between unirradiated and y-irradiated samples were obtained only in the VH configuration, since no spectral variations in the VV configuration were detected for all the compositions studied. Employing the differential representation (Rirrad - IRunirrad.) of the VH Raman spectra measured for the y-irradiated ( IRirrad. ) and unirradiated ( IRunirrad. ) samples, it has been found out that the radiation-induced structural changes are significant only for the glass composition with x = 0.4, while these changes are practically absent in the case of the glass compositions with x = 0.1, 0.2, and 0.6. The applied differential procedure allows also to detect the radiation-induced effects in clusters of corner-shared and edge-shared tetrahedral, which was not possible with IR Fast Fourier Transform spectroscopy due to different activity of IR and Raman bands. In addition, it was shown that the controversial companion Ac₁ mode at 370 cm⁻¹ to the main 340 cm⁻¹ A₁ symmetric mode of vibrations in cornershared tetrahedra seems to be related mainly to the vibrations of edge-shared tetrahedra. The possible nanoscale structural mechanism to account for these spectral changes has been discussed.
The author would like to thank Prof. C. Raptis (National Technical University of Athens (NTUA), Greece) for kindly provided equipment to conduct Raman scattering studies and for his hospitality during his stay at the Physics Department of NTUA supported by the Greek State Scholarships Foundation (I.K.Y.) and Prof. V.M. Tsmots (Ivan Franko Drohobych State Pedagogical University (DSPU), Ukraine) for stimulating discussions. The investigated samples used for measurements were prepared within joint research projects (#0106U007386 and #0109U007446c) between DSPU (Drohobych, Ukraine) and Scientific Research Company “Carat” (Lviv, Ukraine) supported by the Ministry of Education and Science of Ukraine (#0106U007385 and #0109U007445). Support of the Ministry of Education and Science, Youth and Sport of Ukraine (#0111U001021) and the State Fund for Fundamental Researches of Ukraine (#F40.2/019) is also gratefully acknowledged.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Radiation-induced structural changes in chalcogenide glasses as revealed from Raman spectroscopy measurements
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Radiation-induced structural changes in chalcogenide glasses as revealed from Raman spectroscopy measurements
spellingShingle Radiation-induced structural changes in chalcogenide glasses as revealed from Raman spectroscopy measurements
Kavetskyy, T.S.
title_short Radiation-induced structural changes in chalcogenide glasses as revealed from Raman spectroscopy measurements
title_full Radiation-induced structural changes in chalcogenide glasses as revealed from Raman spectroscopy measurements
title_fullStr Radiation-induced structural changes in chalcogenide glasses as revealed from Raman spectroscopy measurements
title_full_unstemmed Radiation-induced structural changes in chalcogenide glasses as revealed from Raman spectroscopy measurements
title_sort radiation-induced structural changes in chalcogenide glasses as revealed from raman spectroscopy measurements
author Kavetskyy, T.S.
author_facet Kavetskyy, T.S.
publishDate 2013
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description Radiation-induced structural changes in the chalcogenide glasses of (As₂S₃)x(GeS₂)₍₁₋х₎ system with x = 0.1, 0.2, 0.4, and 0.6 corresponding to the chemical compositions Ge₂₈.₁₂₅As₆.₂₅S₆₅.₆₂₅, Ge₂₃.₅As₁₁.₈S₆₄.₇, Ge₁₅.₈As₂₁S₆₃.₂, and Ge₉.₅As₂₈.₆S₆₁.₉, respectively, were studied using the Raman spectroscopy technique in detail. The polarized (VV) and depolarized (VH) Raman spectra were recorded separately for two identical samples in the unirradiated and γ-irradiated states which allowed performing all measurements under the same experimental conditions. The Raman spectra were considered in the regions of high-frequency excitations related with the molecular peak, and low-frequency excitations related with the boson peak. The depolarization ratio spectra for the unirradiated and y-irradiated samples were examined, too. The differential Raman spectra in the high-frequency region between unirradiated and y-irradiated samples were obtained only in the VH configuration, since no spectral variations in the VV configuration were detected for all the compositions studied. Employing the differential representation (Rirrad - IRunirrad.) of the VH Raman spectra measured for the y-irradiated ( IRirrad. ) and unirradiated ( IRunirrad. ) samples, it has been found out that the radiation-induced structural changes are significant only for the glass composition with x = 0.4, while these changes are practically absent in the case of the glass compositions with x = 0.1, 0.2, and 0.6. The applied differential procedure allows also to detect the radiation-induced effects in clusters of corner-shared and edge-shared tetrahedral, which was not possible with IR Fast Fourier Transform spectroscopy due to different activity of IR and Raman bands. In addition, it was shown that the controversial companion Ac₁ mode at 370 cm⁻¹ to the main 340 cm⁻¹ A₁ symmetric mode of vibrations in cornershared tetrahedra seems to be related mainly to the vibrations of edge-shared tetrahedra. The possible nanoscale structural mechanism to account for these spectral changes has been discussed.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/117599
citation_txt Radiation-induced structural changes in chalcogenide glasses as revealed from Raman spectroscopy measurements / T.S. Kavetskyy // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2013. — Т. 16, № 1. — С. 27-36. — Бібліогр.: 63 назв. — англ.
work_keys_str_mv AT kavetskyyts radiationinducedstructuralchangesinchalcogenideglassesasrevealedfromramanspectroscopymeasurements
first_indexed 2025-12-07T19:58:59Z
last_indexed 2025-12-07T19:58:59Z
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