Enhanced 2D plotting method for scanning probe microscopy imaging
An enhanced 2D plotting method for scanning probe microscopy imaging implementing a gradient-based value mapping for pseudocolor images and its application to studies of epitaxial layer surface morphology is presented. It is demonstrated that this method is capable of revealing the finest features o...
Gespeichert in:
| Veröffentlicht in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
|---|---|
| Datum: | 2011 |
| 1. Verfasser: | |
| Format: | Artikel |
| Sprache: | English |
| Veröffentlicht: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2011
|
| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/117627 |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Enhanced 2D plotting method for scanning probe microscopy imaging / G.V. Beketov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2011. — Т. 14, № 1. — С. 80-87. — Бібліогр.: 27 назв. — англ. |
Institution
Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
nasplib_isofts_kiev_ua-123456789-117627 |
|---|---|
| record_format |
dspace |
| spelling |
Beketov, G.V. 2017-05-25T17:52:17Z 2017-05-25T17:52:17Z 2011 Enhanced 2D plotting method for scanning probe microscopy imaging / G.V. Beketov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2011. — Т. 14, № 1. — С. 80-87. — Бібліогр.: 27 назв. — англ. 1560-8034 PACS 68.37.Ps, 81.16.-c https://nasplib.isofts.kiev.ua/handle/123456789/117627 An enhanced 2D plotting method for scanning probe microscopy imaging implementing a gradient-based value mapping for pseudocolor images and its application to studies of epitaxial layer surface morphology is presented. It is demonstrated that this method is capable of revealing the finest features on growth surfaces. Presence of elementary growth steps on the surface of flat-topped hillocks found on Hg₀.₈Cd₀.₂Te LPE-grown epitaxial layers, examples of cooperative effects of screw dislocations on PbTe and Hg₁₋xCdxTe epilayer growth as well as atypical surface morphology of PbTe epilayers are discussed. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Enhanced 2D plotting method for scanning probe microscopy imaging Article published earlier |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| title |
Enhanced 2D plotting method for scanning probe microscopy imaging |
| spellingShingle |
Enhanced 2D plotting method for scanning probe microscopy imaging Beketov, G.V. |
| title_short |
Enhanced 2D plotting method for scanning probe microscopy imaging |
| title_full |
Enhanced 2D plotting method for scanning probe microscopy imaging |
| title_fullStr |
Enhanced 2D plotting method for scanning probe microscopy imaging |
| title_full_unstemmed |
Enhanced 2D plotting method for scanning probe microscopy imaging |
| title_sort |
enhanced 2d plotting method for scanning probe microscopy imaging |
| author |
Beketov, G.V. |
| author_facet |
Beketov, G.V. |
| publishDate |
2011 |
| language |
English |
| container_title |
Semiconductor Physics Quantum Electronics & Optoelectronics |
| publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| format |
Article |
| description |
An enhanced 2D plotting method for scanning probe microscopy imaging implementing a gradient-based value mapping for pseudocolor images and its application to studies of epitaxial layer surface morphology is presented. It is demonstrated that this method is capable of revealing the finest features on growth surfaces. Presence of elementary growth steps on the surface of flat-topped hillocks found on Hg₀.₈Cd₀.₂Te LPE-grown epitaxial layers, examples of cooperative effects of screw dislocations on PbTe and Hg₁₋xCdxTe epilayer growth as well as atypical surface morphology of PbTe epilayers are discussed.
|
| issn |
1560-8034 |
| url |
https://nasplib.isofts.kiev.ua/handle/123456789/117627 |
| citation_txt |
Enhanced 2D plotting method for scanning probe microscopy imaging / G.V. Beketov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2011. — Т. 14, № 1. — С. 80-87. — Бібліогр.: 27 назв. — англ. |
| work_keys_str_mv |
AT beketovgv enhanced2dplottingmethodforscanningprobemicroscopyimaging |
| first_indexed |
2025-12-07T20:01:47Z |
| last_indexed |
2025-12-07T20:01:47Z |
| _version_ |
1850881036931563520 |