Simulating the diffraction grating reflectivity using effective medium theory

The features of optical radiation interaction with surface of gratings are
 investigated. The diffraction grating is proposed to be used in the effective medium
 model to test nanostructured surfaces. This object allows obtaining simultaneous
 visualization of different spati...

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Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:2013
Hauptverfasser: Goloborodko, A.A., Goloborodko, N.S., Oberemok, Ye.A., Savenkov, S.N.
Format: Artikel
Sprache:Englisch
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2013
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/117679
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Simulating the diffraction grating reflectivity
 using effective medium theory / A.A. Goloborodko, N.S. Goloborodko, Ye.A. Oberemok, S.N. Savenkov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2013. — Т. 16, № 2. — С. 128-131. — Бібліогр.: 8 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
Beschreibung
Zusammenfassung:The features of optical radiation interaction with surface of gratings are
 investigated. The diffraction grating is proposed to be used in the effective medium
 model to test nanostructured surfaces. This object allows obtaining simultaneous
 visualization of different spatial frequencies and estimation of both structure and surface
 features of 3D-objects. It was shown that the effective medium model could be used to
 predict the reflectivity of nanostructured surfaces by using diffraction gratings with
 different depths of profile. Computer simulations show that the filling factor of
 composite systems could be an angle dependent function. So, the correct solution of the
 inverse problem of finding surface characteristics, such as refraction indices and
 absorption coefficients, is related with the angle dependence of filling factor.
ISSN:1560-8034