APA (7th ed.) Citation

Kladko, V., Kuchuk, A., Safryuk, N., Machulin, V., Belyaev, A., Konakova, R., & Yavich, B. (2010). X-ray diffraction study of deformation state in InGaN/GaN multilayered structures. Semiconductor Physics Quantum Electronics & Optoelectronics.

Chicago Style (17th ed.) Citation

Kladko, V.P, A.V Kuchuk, N.V Safryuk, V.F Machulin, A.E Belyaev, R.V Konakova, and B.S Yavich. "X-ray Diffraction Study of Deformation State in InGaN/GaN Multilayered Structures." Semiconductor Physics Quantum Electronics & Optoelectronics 2010.

MLA (8th ed.) Citation

Kladko, V.P, et al. "X-ray Diffraction Study of Deformation State in InGaN/GaN Multilayered Structures." Semiconductor Physics Quantum Electronics & Optoelectronics, 2010.

Warning: These citations may not always be 100% accurate.